Takahiko Suzuki

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Honjou, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,345,233
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,102,522
- Issue date Jan 24, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring alignment accuracy, as well as m...
- Patent number 7,271,908
- Issue date Sep 18, 2007
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring alignment accuracy, as well as m...
- Patent number 6,897,956
- Issue date May 24, 2005
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120140212
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and inspection method
- Publication number 20090262339
- Publication date Oct 22, 2009
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring alignment accuracy, as well as m...
- Publication number 20050206898
- Publication date Sep 22, 2005
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring alignment accuracy, as well as m...
- Publication number 20030160960
- Publication date Aug 28, 2003
- Minori Noguchi
- G01 - MEASURING TESTING