Takahiro ARAKAWA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Phased-array flaw-detection device and method
- Patent number 11,293,905
- Issue date Apr 5, 2022
- IHI Inspection and Instrumentation Co., Ltd.
- Shintaro Fukumoto
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection device and method
- Patent number 10,345,268
- Issue date Jul 9, 2019
- IHI Inspection and Instrumentation Co., Ltd.
- Hiraku Kawasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHASED-ARRAY FLAW-DETECTION DEVICE AND METHOD
- Publication number 20200116672
- Publication date Apr 16, 2020
- IHI INSPECTION & INSTRUMENTATION CO., LTD.
- Shintaro FUKUMOTO
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION DEVICE AND METHOD
- Publication number 20150160167
- Publication date Jun 11, 2015
- IHI INSPECTION & INSTRUMENTATION CO., LTD.
- Hiraku KAWASAKI
- G01 - MEASURING TESTING