Takahiro HARA

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection method and method of manufacturing semiconductor device
- Patent number 9,343,319
- Issue date May 17, 2016
- Renesas Electronics Corporation
- Shien Cho
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150125969
- Publication date May 7, 2015
- RENESAS ELECTRONICS CORPORATION
- Shien CHO
- G01 - MEASURING TESTING