Takahiro Ikeda

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recording medium processing apparatus
- Patent number 9,944,489
- Issue date Apr 17, 2018
- Fuji Xerox Co., Ltd.
- Kiichiro Arikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Image processing method and image processing program
- Patent number 9,904,988
- Issue date Feb 27, 2018
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor circuit
- Patent number 9,287,088
- Issue date Mar 15, 2016
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrasonic inspection apparatus, ultrasonic probe apparatus used fo...
- Patent number 8,960,006
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Hideo Isobe
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional ultrasonic inspection apparatus
- Patent number 8,811,721
- Issue date Aug 19, 2014
- Kabushiki Kaisha Toshiba
- Shin Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional ultrasonic inspection apparatus
- Patent number 8,488,871
- Issue date Jul 16, 2013
- Kabushiki Kaisha Toshiba
- Shin Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection device and ultrasonic inspection method
- Patent number 8,429,973
- Issue date Apr 30, 2013
- Kabushiki Kaisha Toshiba
- Hideo Isobe
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection apparatus
- Patent number 8,371,171
- Issue date Feb 12, 2013
- Kabushiki Kaisha Toshiba
- Hideo Isobe
- G01 - MEASURING TESTING
Information Patent Grant
Copying apparatus
- Patent number 8,191,422
- Issue date Jun 5, 2012
- Kabushiki Kaisha Toshiba
- Kensuke Maruyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional ultrasonic imaging device
- Patent number 8,020,445
- Issue date Sep 20, 2011
- Kabushiki Kaisha Toshiba
- Masahiro Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Copying apparatus
- Patent number 7,987,723
- Issue date Aug 2, 2011
- Kabushiki Kaisha Toshiba
- Kensuke Maruyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method, apparatus, and computer readable medium for evaluating a sa...
- Patent number 7,930,123
- Issue date Apr 19, 2011
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G05 - CONTROLLING REGULATING
Information Patent Grant
3D ultrasonographic device
- Patent number 7,496,456
- Issue date Feb 24, 2009
- Kabushiki Kaisha Toshiba
- Kazuo Hiyama
- G01 - MEASURING TESTING
Information Patent Grant
Extracting method of pattern contour, image processing method, sear...
- Patent number 7,454,066
- Issue date Nov 18, 2008
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultrasonograph, ultrasonic transducer, examining instrument, and ul...
- Patent number 7,421,900
- Issue date Sep 9, 2008
- Kabushiki Kaisha Toshiba
- Hirokazu Karasawa
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Micropattern measuring method, micropattern measuring apparatus, an...
- Patent number 7,418,363
- Issue date Aug 26, 2008
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for verifying an integrated circuit pattern
- Patent number 7,412,671
- Issue date Aug 12, 2008
- Kabushiki Kaisha Toshiba
- Takeshi Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphic contour extracting method, pattern inspecting method, progr...
- Patent number 7,321,680
- Issue date Jan 22, 2008
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Extracting method of pattern contour, image processing method, sear...
- Patent number 7,305,116
- Issue date Dec 4, 2007
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Exposure method for correcting a focal point, and a method for manu...
- Patent number 7,248,349
- Issue date Jul 24, 2007
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Graphic processing method and device
- Patent number 7,177,480
- Issue date Feb 13, 2007
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of selecting pattern to be measured, pattern inspection meth...
- Patent number 7,075,098
- Issue date Jul 11, 2006
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting exposure apparatus, exposure method for corre...
- Patent number 6,967,719
- Issue date Nov 22, 2005
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Micropattern measuring method, micropattern measuring apparatus, an...
- Patent number 6,963,819
- Issue date Nov 8, 2005
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern evaluation method, pattern evaluation system and computer r...
- Patent number 6,839,470
- Issue date Jan 4, 2005
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and method of controlling the same
- Patent number 6,815,677
- Issue date Nov 9, 2004
- Fujitsu Limited
- Kouichi Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphic contour extracting method, pattern inspecting method, progr...
- Patent number 6,772,089
- Issue date Aug 3, 2004
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fine pattern inspection apparatus and method and managing apparatus...
- Patent number 6,642,519
- Issue date Nov 4, 2003
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern lithography method
- Patent number 5,830,623
- Issue date Nov 3, 1998
- Kabushiki Kaisha Toshiba
- Yumiko Maruyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING METHOD AND IMAGE PROCESSING PROGRAM
- Publication number 20170262963
- Publication date Sep 14, 2017
- Kabushiki Kaisha Toshiba
- Takahiro IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RECORDING MEDIUM PROCESSING APPARATUS
- Publication number 20170088387
- Publication date Mar 30, 2017
- FUJI XEROX CO., LTD
- Kiichiro ARIKAWA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
OBJECT DISTRIBUTION ANALYSIS APPARATUS AND OBJECT DISTRIBUTION ANAL...
- Publication number 20150354952
- Publication date Dec 10, 2015
- Kabushiki Kaisha Toshiba
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CIRCUIT
- Publication number 20150060661
- Publication date Mar 5, 2015
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20140368186
- Publication date Dec 18, 2014
- Kabushiki Kaisha Toshiba
- Takahiro IKEDA
- G01 - MEASURING TESTING
Information Patent Application
ANOMALY DETECTION METHOD, COMPUTER-READABLE NON-TRANSITORY STORAGE...
- Publication number 20140244020
- Publication date Aug 28, 2014
- Kabushiki Kaisha Toshiba
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS
- Publication number 20120243771
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Shin Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS
- Publication number 20110102429
- Publication date May 5, 2011
- Kabushiki Kaisha Toshiba
- Shin Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION APPARATUS
- Publication number 20110000300
- Publication date Jan 6, 2011
- Kabushiki Kaisha Toshiba
- Hideo ISOBE
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION DEVICE AND ULTRASONIC INSPECTION METHOD
- Publication number 20100251822
- Publication date Oct 7, 2010
- Kabushiki Kaisha Toshiba
- Hideo ISOBE
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION APPARATUS, ULTRASONIC PROBE APPARATUS USED FO...
- Publication number 20100212429
- Publication date Aug 26, 2010
- Hideo Isobe
- G01 - MEASURING TESTING
Information Patent Application
COPYING APPARATUS
- Publication number 20090293620
- Publication date Dec 3, 2009
- Kensuke Maruyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
COPYING APPARATUS
- Publication number 20090288490
- Publication date Nov 26, 2009
- Kensuke Maruyama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATU...
- Publication number 20090192743
- Publication date Jul 30, 2009
- Takahiro IKEDA
- G05 - CONTROLLING REGULATING
Information Patent Application
Three-Dimensional Ultrasonic Imaging Device
- Publication number 20080245150
- Publication date Oct 9, 2008
- Kabushiki Kaisha Toshiba
- Masahiro Katayama
- G01 - MEASURING TESTING
Information Patent Application
Extracting method of pattern contour, image processing method, sear...
- Publication number 20080069451
- Publication date Mar 20, 2008
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Ultrasonographic Device
- Publication number 20070282543
- Publication date Dec 6, 2007
- KABUSHIKI KAISHA TOSHIBA
- Kazuo Hiyama
- G01 - MEASURING TESTING
Information Patent Application
Exposure method for correcting a focal point, and a method for manu...
- Publication number 20060061756
- Publication date Mar 23, 2006
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pattern measuring method, pattern measuring apparatus, photo mask m...
- Publication number 20060039596
- Publication date Feb 23, 2006
- Shigeki Nojima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Micropattern measuring method, micropattern measuring apparatus, an...
- Publication number 20050278138
- Publication date Dec 15, 2005
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for verifying an integrated circuit pattern
- Publication number 20050086618
- Publication date Apr 21, 2005
- Takeshi Ito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Graphic processing method and device
- Publication number 20050024361
- Publication date Feb 3, 2005
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Graphic contour extracting method, pattern inspecting method, progr...
- Publication number 20040181361
- Publication date Sep 16, 2004
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of selecting pattern to be measured, pattern inspection meth...
- Publication number 20040155208
- Publication date Aug 12, 2004
- Takahiro Ikeda
- G01 - MEASURING TESTING
Information Patent Application
Micropattern measuring method, micropattern measuring apparatus, an...
- Publication number 20040131246
- Publication date Jul 8, 2004
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Extracting method of pattern contour, image processing method, sear...
- Publication number 20040096092
- Publication date May 20, 2004
- Takahiro Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ultrasonograph, ultrasonic transducer, examining instrument, and ul...
- Publication number 20040024320
- Publication date Feb 5, 2004
- Hirokazu Karasawa
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
Method for inspecting exposure apparatus, exposure method for corre...
- Publication number 20030117627
- Publication date Jun 26, 2003
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask trading system and method
- Publication number 20030078799
- Publication date Apr 24, 2003
- Masafumi Asano
- G06 - COMPUTING CALCULATING COUNTING

Takahiro Ikeda

Person

Patents Grantslast 30 patents

Atom probe inspection device, field ion microscope, and distortion...

Recording medium processing apparatus

Image processing method and image processing program

Semiconductor circuit

Ultrasonic inspection apparatus, ultrasonic probe apparatus used fo...

Three-dimensional ultrasonic inspection apparatus

Three-dimensional ultrasonic inspection apparatus

Ultrasonic inspection device and ultrasonic inspection method

Ultrasonic inspection apparatus

Copying apparatus

Three-dimensional ultrasonic imaging device

Copying apparatus

Method, apparatus, and computer readable medium for evaluating a sa...

3D ultrasonographic device

Extracting method of pattern contour, image processing method, sear...

Ultrasonograph, ultrasonic transducer, examining instrument, and ul...

Micropattern measuring method, micropattern measuring apparatus, an...

Apparatus and method for verifying an integrated circuit pattern

Graphic contour extracting method, pattern inspecting method, progr...

Extracting method of pattern contour, image processing method, sear...

Exposure method for correcting a focal point, and a method for manu...

Graphic processing method and device

Method of selecting pattern to be measured, pattern inspection meth...

Method for inspecting exposure apparatus, exposure method for corre...

Micropattern measuring method, micropattern measuring apparatus, an...

Pattern evaluation method, pattern evaluation system and computer r...

Scanning electron microscope and method of controlling the same

Graphic contour extracting method, pattern inspecting method, progr...

Fine pattern inspection apparatus and method and managing apparatus...

Pattern lithography method

Patents Applicationslast 30 patents

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

IMAGE PROCESSING METHOD AND IMAGE PROCESSING PROGRAM

RECORDING MEDIUM PROCESSING APPARATUS

OBJECT DISTRIBUTION ANALYSIS APPARATUS AND OBJECT DISTRIBUTION ANAL...

SEMICONDUCTOR CIRCUIT

INSPECTION APPARATUS AND INSPECTION METHOD

ANOMALY DETECTION METHOD, COMPUTER-READABLE NON-TRANSITORY STORAGE...

THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS

THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS

ULTRASONIC INSPECTION APPARATUS

ULTRASONIC INSPECTION DEVICE AND ULTRASONIC INSPECTION METHOD

ULTRASONIC INSPECTION APPARATUS, ULTRASONIC PROBE APPARATUS USED FO...

COPYING APPARATUS

COPYING APPARATUS

SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATU...

Three-Dimensional Ultrasonic Imaging Device

Extracting method of pattern contour, image processing method, sear...

3D Ultrasonographic Device

Exposure method for correcting a focal point, and a method for manu...

Pattern measuring method, pattern measuring apparatus, photo mask m...

Micropattern measuring method, micropattern measuring apparatus, an...

Apparatus and method for verifying an integrated circuit pattern

Graphic processing method and device

Graphic contour extracting method, pattern inspecting method, progr...

Method of selecting pattern to be measured, pattern inspection meth...

Micropattern measuring method, micropattern measuring apparatus, an...

Extracting method of pattern contour, image processing method, sear...

Ultrasonograph, ultrasonic transducer, examining instrument, and ul...

Method for inspecting exposure apparatus, exposure method for corre...

Mask trading system and method