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Takahiro KUMAGAI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,044,692
    • Issue date Jul 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,933,804
    • Issue date Mar 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,885,824
    • Issue date Jan 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,474,119
    • Issue date Oct 18, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,041,872
    • Issue date Jun 22, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Kazuhiro Noda
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTROLYTE ANALYZER
    • Publication number 20230288439
    • Publication date Sep 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230251279
    • Publication date Aug 10, 2023
    • Hitachi High-Tech Corporation
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230044702
    • Publication date Feb 9, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichi Iwase
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    ELECTROLYTE ANALYSIS APPARATUS
    • Publication number 20230032886
    • Publication date Feb 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220146543
    • Publication date May 12, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210318350
    • Publication date Oct 14, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210239727
    • Publication date Aug 5, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200217863
    • Publication date Jul 9, 2020
    • Hitachi High-Technologies Corporation
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190094250
    • Publication date Mar 28, 2019
    • Hitachi High-Technologies Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING