Takahiro NAGASAWA

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Saga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating coordinate position identification accuracy o...
- Patent number 12,188,880
- Issue date Jan 7, 2025
- Sumco Corporation
- Keiichiro Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer evaluation method and manufacturing method and...
- Patent number 12,027,428
- Issue date Jul 2, 2024
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer manuf...
- Patent number 11,955,390
- Issue date Apr 9, 2024
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer evaluation standard setting method, semiconduct...
- Patent number 10,261,125
- Issue date Apr 16, 2019
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING SILICON SINGLE-CRYSTAL INGOT, METHOD OF EVALUA...
- Publication number 20240230553
- Publication date Jul 11, 2024
- SUMCO CORPORATION
- Jun FURUKAWA
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF CALIBRATING COORDINATE POSITION IDENTIFICATION ACCURACY O...
- Publication number 20220373478
- Publication date Nov 24, 2022
- SUMCO CORPORATION
- Keiichiro MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD AND MANUFACTURING METHOD AND...
- Publication number 20220102225
- Publication date Mar 31, 2022
- SUMCO CORPORATION
- Takahiro NAGASAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD AND SEMICONDUCTOR WAFER MANUF...
- Publication number 20200411391
- Publication date Dec 31, 2020
- SUMCO CORPORATION
- Takahiro NAGASAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION STANDARD SETTING METHOD, SEMICONDUCT...
- Publication number 20180136279
- Publication date May 17, 2018
- SUMCO CORPORATION
- Takahiro NAGASAWA
- G01 - MEASURING TESTING