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Takahiro Nagata

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Patents Grantslast 30 patents

  • Information Patent Grant

    Inspection device
    • Patent number 11,204,368
    • Issue date Dec 21, 2021
    • Yokowo Co., Ltd.
    • Masaki Noguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection jig
    • Patent number 10,866,265
    • Issue date Dec 15, 2020
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection jig
    • Patent number 10,712,383
    • Issue date Jul 14, 2020
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection jig
    • Patent number 10,598,694
    • Issue date Mar 24, 2020
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Exchangeable contact unit and inspection jig
    • Patent number 10,393,771
    • Issue date Aug 27, 2019
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe cover
    • Patent number 10,324,110
    • Issue date Jun 18, 2019
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Contact unit and inspection jig
    • Patent number 10,024,883
    • Issue date Jul 17, 2018
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe with reduced voltage drop and heat generation
    • Patent number 7,772,864
    • Issue date Aug 10, 2010
    • Yokowo Co., Ltd.
    • Takahiro Nagata
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    INSPECTION DEVICE
    • Publication number 20200300889
    • Publication date Sep 24, 2020
    • YOKOWO CO., LTD
    • Masaki NOGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION JIG
    • Publication number 20190187205
    • Publication date Jun 20, 2019
    • YOKOWO CO., LTD
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION JIG
    • Publication number 20190187178
    • Publication date Jun 20, 2019
    • YOKOWO CO., LTD
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION JIG
    • Publication number 20190187181
    • Publication date Jun 20, 2019
    • YOKOWO CO., LTD
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT UNIT AND INSPECTION JIG
    • Publication number 20170074902
    • Publication date Mar 16, 2017
    • YOKOWO CO., LTD.
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE COVER
    • Publication number 20170038412
    • Publication date Feb 9, 2017
    • Yokowo Co., Ltd.
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT UNIT AND INSPECTION JIG
    • Publication number 20160282386
    • Publication date Sep 29, 2016
    • YOKOWO CO., LTD
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXCHANGEABLE CONTACT UNIT AND INSPECTION JIG
    • Publication number 20160187378
    • Publication date Jun 30, 2016
    • YOKOWO CO., LTD.
    • Takahiro NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND SOCKET, AND MANUFACTURING METHOD OF TUBE PLUNGER...
    • Publication number 20110221464
    • Publication date Sep 15, 2011
    • Advantest Corporation
    • Takahiro Nagata
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe
    • Publication number 20080048702
    • Publication date Feb 28, 2008
    • YOKOWO CO., LTD
    • Takahiro Nagata
    • G01 - MEASURING TESTING