Membership
Tour
Register
Log in
Takahiro Nagata
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Image processing
Patent number
7,348,978
Issue date
Mar 25, 2008
Kabushiki Kaisha Sega
Takahiro Nagata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test probe for semiconductor devices, method of manufacturing of th...
Patent number
6,888,344
Issue date
May 3, 2005
Mitsubishi Denki Kabushiki Kaisha
Shigeki Maekawa
G01 - MEASURING TESTING
Information
Patent Grant
Test probe for semiconductor devices, method of manufacturing of th...
Patent number
6,646,455
Issue date
Nov 11, 2003
Mitsubishi Denki Kabsuhiki Kaisha
Shigeki Maekawa
G01 - MEASURING TESTING
Information
Patent Grant
Waveform observing jig and waveform observing device
Patent number
6,441,621
Issue date
Aug 27, 2002
Ando Electric Co., Ltd.
Takahiro Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Test head for IC tester
Patent number
5,936,417
Issue date
Aug 10, 1999
Ando Electric Co., Ltd.
Takahiro Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Change-over circuit for tester implemented by using diode-bridge ty...
Patent number
5,276,355
Issue date
Jan 4, 1994
Ando Electric Co., Ltd.
Takahiro Nagata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Image processing
Publication number
20050280645
Publication date
Dec 22, 2005
Kabushiki Kaisha Sega.
Takahiro Nagata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test probe for semiconductor devices, method of manufacturing of th...
Publication number
20030090280
Publication date
May 15, 2003
SHIGEKI MAEKAWA
G01 - MEASURING TESTING
Information
Patent Application
TEST PROBE FOR SEMICONDUCTOR DEVICES, METHOD OF MANUFACTURING OF TH...
Publication number
20020097060
Publication date
Jul 25, 2002
SHIGEKI MAEKAWA
G01 - MEASURING TESTING
Information
Patent Application
Waveform observing jig and waveform observing device
Publication number
20010005140
Publication date
Jun 28, 2001
Takahiro Nagata
G01 - MEASURING TESTING