Takahiro NAKAJIMA

Person

  • Gunma, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Test apparatus and test module

    • Patent number 9,342,425
    • Issue date May 17, 2016
    • Advantest Corporation
    • Takeshi Yaguchi
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Test apparatus and test module

    • Patent number 9,223,670
    • Issue date Dec 29, 2015
    • Advantest Corporation
    • Hajime Sugimura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Test apparatus and test module

    • Patent number 9,201,750
    • Issue date Dec 1, 2015
    • Advantest Corporation
    • Hajime Sugimura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Performance board and testing system

    • Patent number 7,262,590
    • Issue date Aug 28, 2007
    • Advantest Corporation
    • Takahiro Nakajima
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST APPARATUS AND TEST MODULE

    • Publication number 20130231888
    • Publication date Sep 5, 2013
    • Advantest Corporation
    • Hajime SUGIMURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND TEST MODULE

    • Publication number 20130231887
    • Publication date Sep 5, 2013
    • Advantest Corporation
    • Hajime SUGIMURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND TEST MODULE

    • Publication number 20130231886
    • Publication date Sep 5, 2013
    • Advantest Corporation
    • Takeshi YAGUCHI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    TEST APPARATUS AND TEST MODULE

    • Publication number 20130231885
    • Publication date Sep 5, 2013
    • Advantest Corporation
    • Hajime SUGIMURA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Performance board and testing system

    • Publication number 20050212544
    • Publication date Sep 29, 2005
    • Advantest Corporation
    • Takahiro Nakajima
    • G01 - MEASURING TESTING