Takahiro Ohnakado

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Rotation state detecting device and rotation state detecting method
- Patent number 7,205,761
- Issue date Apr 17, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Circuit protecting against electrostatic discharge
- Patent number 6,847,511
- Issue date Jan 25, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Si-MOS high-frequency semiconductor device
- Patent number 6,844,596
- Issue date Jan 18, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,734,509
- Issue date May 11, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile semiconductor memory device and manufacturing method t...
- Patent number 6,635,920
- Issue date Oct 21, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection circuit for a semiconductor device
- Patent number 6,600,198
- Issue date Jul 29, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device having floating gate electrode
- Patent number 5,901,084
- Issue date May 4, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Rotation state detecting device and rotation state detecting method
- Publication number 20050206371
- Publication date Sep 22, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Manabu Tsukamoto
- G01 - MEASURING TESTING
Information Patent Application
High-frequency semiconductor device
- Publication number 20030117206
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit
- Publication number 20030075765
- Publication date Apr 24, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit protecting against electrostatic discharge
- Publication number 20030008463
- Publication date Jan 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20020146878
- Publication date Oct 10, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Si-MOS high-frequency semiconductor device and the manufacturing me...
- Publication number 20020033504
- Publication date Mar 21, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takahiro Ohnakado
- H01 - BASIC ELECTRIC ELEMENTS

Takahiro Ohnakado

Person

Patents Grantslast 30 patents

Rotation state detecting device and rotation state detecting method

Circuit protecting against electrostatic discharge

Si-MOS high-frequency semiconductor device

Semiconductor integrated circuit

Non-volatile semiconductor memory device and manufacturing method t...

Electrostatic discharge protection circuit for a semiconductor device

Nonvolatile semiconductor memory device having floating gate electrode

Patents Applicationslast 30 patents

Rotation state detecting device and rotation state detecting method

High-frequency semiconductor device

Semiconductor integrated circuit

Circuit protecting against electrostatic discharge

SEMICONDUCTOR DEVICE

Si-MOS high-frequency semiconductor device and the manufacturing me...