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Takahiro Oikawa
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Kameoka-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Photoelectric sensor and method for manufacturing same
Patent number
11,920,951
Issue date
Mar 5, 2024
Omron Corporation
Jumpei Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric sensor with deflection angle adjustment arrangement
Patent number
6,982,410
Issue date
Jan 3, 2006
Omron Corporation
Takahiro Oikawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTOELECTRIC SENSOR AND METHOD FOR MANUFACTURING SAME
Publication number
20220082380
Publication date
Mar 17, 2022
Omron Corporation
Jumpei NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
ABNORMALITY PROCESSING SYSTEM
Publication number
20180004907
Publication date
Jan 4, 2018
Omron Corporation
Yahiro KOEZUKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Photoelectric sensor
Publication number
20040079871
Publication date
Apr 29, 2004
OMRON CORPORATION
Takahiro Oikawa
G01 - MEASURING TESTING