Takahiro Oikawa

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device socket

    • Patent number 7,230,830
    • Issue date Jun 12, 2007
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC socket

    • Patent number 6,758,684
    • Issue date Jul 6, 2004
    • Yamaichi Electronics Co., Ltd.
    • Takahiro Oikawa
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

  • Information Patent Application

    Semiconductor device socket

    • Publication number 20050231919
    • Publication date Oct 20, 2005
    • Yamaichi Electronics Co., Ltd.
    • Ryo Ujike
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC socket

    • Publication number 20020187665
    • Publication date Dec 12, 2002
    • Yamaichi Electronics Co., Ltd.
    • Takahiro Oikawa
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR