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Takahiro OKUDA

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  • Fukuchiyama-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Optical measuring device
    • Patent number 11,231,270
    • Issue date Jan 25, 2022
    • Omron Corporation
    • Takahiro Okuda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photoelectric sensor
    • Patent number 10,921,181
    • Issue date Feb 16, 2021
    • Omron Corporation
    • Motoki Tanaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Photoelectric sensor comprising at least one of a light projecting...
    • Patent number 10,760,952
    • Issue date Sep 1, 2020
    • Omron Corporation
    • Jumpei Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor head
    • Patent number 10,663,285
    • Issue date May 26, 2020
    • Omron Corporation
    • Mariko Marukawa
    • G11 - INFORMATION STORAGE
  • Information Patent Grant

    Sensor head for positioning sensor
    • Patent number 10,571,247
    • Issue date Feb 25, 2020
    • Omron Corporation
    • Mariko Marukawa
    • G02 - OPTICS
  • Information Patent Grant

    Confocal measurement device
    • Patent number 10,520,296
    • Issue date Dec 31, 2019
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor head
    • Patent number 10,274,309
    • Issue date Apr 30, 2019
    • Omron Corporation
    • Mariko Marukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal measuring device
    • Patent number 10,247,602
    • Issue date Apr 2, 2019
    • Omron Corporation
    • Mariko Marukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,040,529
    • Issue date Oct 18, 2011
    • Omron Corporation
    • Takahiro Okuda
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR HEAD
    • Publication number 20190285399
    • Publication date Sep 19, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC SENSOR
    • Publication number 20190285462
    • Publication date Sep 19, 2019
    • Omron Corporation
    • Jumpei NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTOELECTRIC SENSOR
    • Publication number 20190285466
    • Publication date Sep 19, 2019
    • Omron Corporation
    • Motoki TANAKA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASURING DEVICE
    • Publication number 20190277621
    • Publication date Sep 12, 2019
    • Omron Corporation
    • Takahiro OKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR HEAD
    • Publication number 20190101374
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASUREMENT DEVICE
    • Publication number 20190101375
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR HEAD
    • Publication number 20190101378
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASURING DEVICE
    • Publication number 20180259390
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20100231925
    • Publication date Sep 16, 2010
    • OMRON CORPORATION
    • Takahiro OKUDA
    • G02 - OPTICS