Takahiro Omori

Person

Kawasaki Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and inspection device
- Patent number 12,040,303
- Issue date Jul 16, 2024
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 11,668,681
- Issue date Jun 6, 2023
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Sensor including deformable part
- Patent number 11,513,102
- Issue date Nov 29, 2022
- University of Tokyo
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sensor module
- Patent number 11,474,081
- Issue date Oct 18, 2022
- Kabushiki Kaisha Toshiba
- Yongfang Li
- G01 - MEASURING TESTING
Information Patent Grant
Sensor including deformable parts
- Patent number 11,442,041
- Issue date Sep 13, 2022
- The University of Tokyo
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sensor module
- Patent number 11,417,824
- Issue date Aug 16, 2022
- Kabushiki Kaisha Toshiba
- Yongfang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,073,498
- Issue date Jul 27, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,041,830
- Issue date Jun 22, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 10,955,383
- Issue date Mar 23, 2021
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing apparatus, server, detection system, and signal p...
- Patent number 10,545,119
- Issue date Jan 28, 2020
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 10,365,250
- Issue date Jul 30, 2019
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 10,234,429
- Issue date Mar 19, 2019
- Kabushiki Kaisha Toshiba
- Isao Shimoyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Detection system and detection method
- Patent number 10,018,597
- Issue date Jul 10, 2018
- Kabushiki Kaisha Toshiba
- Junko Hirokawa
- G01 - MEASURING TESTING
Information Patent Grant
Thermal printer, control method, and computer program
- Patent number 9,962,954
- Issue date May 8, 2018
- Kabushiki Kaisha Toshiba
- Shinichi Tatsuta
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Detection system and detection method
- Patent number 9,921,188
- Issue date Mar 20, 2018
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- E04 - BUILDING
Information Patent Grant
Thermal printer, control method, and computer program
- Patent number 9,669,636
- Issue date Jun 6, 2017
- Kabushiki Kaisha Toshiba
- Shinichi Tatsuta
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Device and system detecting breakage in dummy bumps and method thereof
- Patent number 9,383,401
- Issue date Jul 5, 2016
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic apparatus, a method for deciding a failure, and a method...
- Patent number 9,310,414
- Issue date Apr 12, 2016
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G01 - MEASURING TESTING
Information Patent Grant
Electronic apparatus, a method for estimating a break, and a method...
- Patent number 9,091,610
- Issue date Jul 28, 2015
- Kabushiki Kaisha Toshiba
- Yousuke Hisakuni
- G01 - MEASURING TESTING
Information Patent Grant
Life predicting method for solder joint, life predicting apparatus...
- Patent number 8,965,712
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Raid system based on calculated average of mechanical loads and sol...
- Patent number 8,615,627
- Issue date Dec 24, 2013
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring device and monitoring method
- Patent number 8,321,157
- Issue date Nov 27, 2012
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G01 - MEASURING TESTING
Information Patent Grant
Method of estimating support state of an electronic apparatus housi...
- Patent number 8,175,837
- Issue date May 8, 2012
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Method of estimating support state of an electronic apparatus housi...
- Patent number 7,869,975
- Issue date Jan 11, 2011
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Cooling device and electronic apparatus having the cooling device
- Patent number 7,852,628
- Issue date Dec 14, 2010
- Kabushiki Kaisha Toshiba
- Kenji Hirohata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION DEVICE
- Publication number 20210296279
- Publication date Sep 23, 2021
- Kabushiki Kaisha Toshiba
- Mitsuaki KATO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20210181156
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20200408722
- Publication date Dec 31, 2020
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20200408721
- Publication date Dec 31, 2020
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE
- Publication number 20200292505
- Publication date Sep 17, 2020
- Kabushiki Kaisha Toshiba
- Yongfang Li
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE
- Publication number 20200295250
- Publication date Sep 17, 2020
- Kabushiki Kaisha Toshiba
- Yongfang LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD
- Publication number 20200018729
- Publication date Jan 16, 2020
- Kabushiki Kaisha Toshiba
- Tomoya FUMIKURA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20190302061
- Publication date Oct 3, 2019
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, WHEEL, AND DETECTION METHOD
- Publication number 20190285590
- Publication date Sep 19, 2019
- Kabushiki Kaisha Toshiba
- Junko HIROKAWA
- G01 - MEASURING TESTING
Information Patent Application
THERMAL PRINTER, CONTROL METHOD, AND COMPUTER PROGRAM
- Publication number 20170232759
- Publication date Aug 17, 2017
- Kabushiki Kaisha Toshiba
- Shinichi TATSUTA
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20170138910
- Publication date May 18, 2017
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
THERMAL PRINTER, CONTROL METHOD, AND COMPUTER PROGRAM
- Publication number 20170028741
- Publication date Feb 2, 2017
- Kabushiki Kaisha Toshiba
- Shinichi TATSUTA
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SENSOR
- Publication number 20170003313
- Publication date Jan 5, 2017
- Kabushiki Kaisha Toshiba
- Takahiro OMORI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20160327523
- Publication date Nov 10, 2016
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20160282311
- Publication date Sep 29, 2016
- Kabushiki Kaisha Toshiba
- Junko HIROKAWA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS, SERVER, DETECTION SYSTEM, AND SIGNAL P...
- Publication number 20160139084
- Publication date May 19, 2016
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20160084803
- Publication date Mar 24, 2016
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS, A METHOD FOR ESTIMATING A BREAK, AND A METHOD...
- Publication number 20130312523
- Publication date Nov 28, 2013
- Yousuke HISAKUNI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS, A METHOD FOR DECIDING A FAILURE, AND A METHOD...
- Publication number 20130257450
- Publication date Oct 3, 2013
- Takahiro OMORI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND ELECTRONIC SYSTEM
- Publication number 20120306529
- Publication date Dec 6, 2012
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND DAMAGE DETECTING METHOD
- Publication number 20120179391
- Publication date Jul 12, 2012
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LIFE PREDICTING METHOD FOR SOLDER JOINT, LIFE PREDICTING APPARATUS...
- Publication number 20120072129
- Publication date Mar 22, 2012
- Takahiro OMORI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
RAID SYSTEM INCLUDING SEMICONDUCTOR STORAGE UNIT AND CONTROL METHOD...
- Publication number 20110271052
- Publication date Nov 3, 2011
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ESTIMATING SUPPORT STATE OF AN ELECTRONIC APPARATUS HOUSI...
- Publication number 20110072902
- Publication date Mar 31, 2011
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- G01 - MEASURING TESTING
Information Patent Application
MONITORING DEVICE AND MONITORING METHOD
- Publication number 20100250149
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Takahiro Omori
- G01 - MEASURING TESTING
Information Patent Application
COOLING DEVICE AND ELECTRONIC APPARATUS HAVING THE COOLING DEVICE
- Publication number 20090244843
- Publication date Oct 1, 2009
- Kabushiki Kaisha Toshiba
- Kenji Hirohata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of estimating support state of an electronic apparatus housi...
- Publication number 20090063083
- Publication date Mar 5, 2009
- Kabushiki Kaisha Toshiba
- Minoru Mukai
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY APPARATUS
- Publication number 20070137082
- Publication date Jun 21, 2007
- Takahiro Omori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronic apparatus
- Publication number 20070023733
- Publication date Feb 1, 2007
- Kabushiki Kaisha Toshiba
- Toshio Ooe
- G06 - COMPUTING CALCULATING COUNTING

Takahiro Omori

Person

Patents Grantslast 30 patents

Semiconductor device and inspection device

Detection device, detection system, and detection method

Sensor including deformable part

Sensor module

Sensor including deformable parts

Sensor module

Detection system, detection device, and detection method

Detection system, detection device, and detection method

Detection device, detection system, and detection method

Signal processing apparatus, server, detection system, and signal p...

Detection device, detection system, and detection method

Sensor

Detection system and detection method

Thermal printer, control method, and computer program

Detection system and detection method

Thermal printer, control method, and computer program

Device and system detecting breakage in dummy bumps and method thereof

Electronic apparatus, a method for deciding a failure, and a method...

Electronic apparatus, a method for estimating a break, and a method...

Life predicting method for solder joint, life predicting apparatus...

Raid system based on calculated average of mechanical loads and sol...

Monitoring device and monitoring method

Method of estimating support state of an electronic apparatus housi...

Method of estimating support state of an electronic apparatus housi...

Cooling device and electronic apparatus having the cooling device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND INSPECTION DEVICE

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

SENSOR

SENSOR

SENSOR MODULE

SENSOR MODULE

DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

DETECTION SYSTEM, WHEEL, AND DETECTION METHOD

THERMAL PRINTER, CONTROL METHOD, AND COMPUTER PROGRAM

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

THERMAL PRINTER, CONTROL METHOD, AND COMPUTER PROGRAM

SENSOR

SENSOR

DETECTION SYSTEM AND DETECTION METHOD

SIGNAL PROCESSING APPARATUS, SERVER, DETECTION SYSTEM, AND SIGNAL P...

DETECTION SYSTEM AND DETECTION METHOD

ELECTRONIC APPARATUS, A METHOD FOR ESTIMATING A BREAK, AND A METHOD...

ELECTRONIC APPARATUS, A METHOD FOR DECIDING A FAILURE, AND A METHOD...

ELECTRONIC DEVICE AND ELECTRONIC SYSTEM

ELECTRONIC DEVICE AND DAMAGE DETECTING METHOD

LIFE PREDICTING METHOD FOR SOLDER JOINT, LIFE PREDICTING APPARATUS...

RAID SYSTEM INCLUDING SEMICONDUCTOR STORAGE UNIT AND CONTROL METHOD...

METHOD OF ESTIMATING SUPPORT STATE OF AN ELECTRONIC APPARATUS HOUSI...

MONITORING DEVICE AND MONITORING METHOD

COOLING DEVICE AND ELECTRONIC APPARATUS HAVING THE COOLING DEVICE

Method of estimating support state of an electronic apparatus housi...

DISPLAY APPARATUS

Electronic apparatus