Takahiro SAINO

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for notifying sample analyzer status and sample analysis system
- Patent number 12,196,683
- Issue date Jan 14, 2025
- Sysmex Corporation
- Koki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Sample measurement apparatus and method of measuring samples
- Patent number 10,908,173
- Issue date Feb 2, 2021
- Sysmex Corporation
- Mitsuo Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and rack
- Patent number 10,234,364
- Issue date Mar 19, 2019
- SYSMEX CORPORATION
- Takaaki Nagai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample processing apparatus and rack
- Patent number 9,733,161
- Issue date Aug 15, 2017
- SYSMEX CORPORATION
- Takaaki Nagai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR NOTIFYING SAMPLE ANALYZER STATUS AND SAMPLE ANALYSIS SYSTEM
- Publication number 20200182797
- Publication date Jun 11, 2020
- SYSMEX CORPORATION
- Koki NAKANO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
- Publication number 20170363521
- Publication date Dec 21, 2017
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASUREMENT APPARATUS AND METHOD OF MEASURING SAMPLES
- Publication number 20170242046
- Publication date Aug 24, 2017
- SYSMEX CORPORATION
- Mitsuo YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
- Publication number 20150185120
- Publication date Jul 2, 2015
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING