Takahiro Shikibu

Follow

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a plurality of chips being stacked
- Patent number 10,593,645
- Issue date Mar 17, 2020
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method for controlling test circuit
- Patent number 9,835,685
- Issue date Dec 5, 2017
- Fujitsu Limited
- Gen Oshiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 9,823,291
- Issue date Nov 21, 2017
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method of controlling test circuit
- Patent number 9,797,949
- Issue date Oct 24, 2017
- Fujitsu Limited
- Gen Oshiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 9,746,878
- Issue date Aug 29, 2017
- Fujitsu Limited
- Gen Oshiyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170033085
- Publication date Feb 2, 2017
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD OF CONTROLLING TEST CIRCUIT
- Publication number 20160187421
- Publication date Jun 30, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20160154049
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD FOR CONTROLLING TEST CIRCUIT
- Publication number 20160154057
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20160043029
- Publication date Feb 11, 2016
- Fujitsu Limited
- Takahiro SHIKIBU
- G01 - MEASURING TESTING