Takahiro Togashi

Person

Kamisato, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for detecting particles and defects and inspection equipment...
- Patent number RE44977
- Issue date Jul 1, 2014
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- 356 - Optics: measuring and testing
Information Patent Grant
Method for detecting particles and defects and inspection equipment...
- Patent number RE44840
- Issue date Apr 15, 2014
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- 356 - Optics: measuring and testing
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 8,289,507
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting particles and defects and inspection equipment...
- Patent number 8,094,298
- Issue date Jan 10, 2012
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,952,700
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,817,261
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting particles and defects and inspection equipment...
- Patent number 7,619,729
- Issue date Nov 17, 2009
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting particles and defects and inspection equipment...
- Patent number 7,456,948
- Issue date Nov 25, 2008
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of apparatus for detecting particles on a specimen
- Patent number 7,369,223
- Issue date May 6, 2008
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110228258
- Publication date Sep 22, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN
- Publication number 20110032515
- Publication date Feb 10, 2011
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT...
- Publication number 20100020315
- Publication date Jan 28, 2010
- Hitachi High-Technologies Corp
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT...
- Publication number 20090066941
- Publication date Mar 12, 2009
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Application
Inspection device and inspection method of an object to be inspected
- Publication number 20080218751
- Publication date Sep 11, 2008
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Application
Method Of Apparatus For Detecting Particles On A Specimen
- Publication number 20080204724
- Publication date Aug 28, 2008
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
Method for detecting particles and defects and inspection equipment...
- Publication number 20080007725
- Publication date Jan 10, 2008
- Hitachi High-Technologies Corporation
- Takahiro Togashi
- G01 - MEASURING TESTING
Information Patent Application
Method of apparatus for detecting particles on a specimen
- Publication number 20050213086
- Publication date Sep 29, 2005
- Akira Hamamatsu
- G01 - MEASURING TESTING

Takahiro Togashi

Person

Patents Grantslast 30 patents

Method for detecting particles and defects and inspection equipment...

Method for detecting particles and defects and inspection equipment...

Method of apparatus for detecting particles on a specimen

Method for detecting particles and defects and inspection equipment...

Method of apparatus for detecting particles on a specimen

Method of apparatus for detecting particles on a specimen

Method for detecting particles and defects and inspection equipment...

Method for detecting particles and defects and inspection equipment...

Method of apparatus for detecting particles on a specimen

Patents Applicationslast 30 patents

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT...

METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT...

Inspection device and inspection method of an object to be inspected

Method Of Apparatus For Detecting Particles On A Specimen

Method for detecting particles and defects and inspection equipment...

Method of apparatus for detecting particles on a specimen