Takahiro URANO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection apparatus and defect inspection program
- Patent number 12,112,963
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 11,788,973
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection information generation device, inspection information ge...
- Patent number 11,041,815
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 10,861,145
- Issue date Dec 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,816,484
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Flaw inspection device and flaw inspection method
- Patent number 10,466,181
- Issue date Nov 5, 2019
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 9,865,046
- Issue date Jan 9, 2018
- Hitachi High-Technologies Corporation
- Takahiro Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,778,206
- Issue date Oct 3, 2017
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 9,075,026
- Issue date Jul 7, 2015
- Hitachi High-Technologies Corporation
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and method of inspecting defect
- Patent number 8,908,172
- Issue date Dec 9, 2014
- Hitachi High-Technologies Corporation
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting defect
- Patent number 8,737,718
- Issue date May 27, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Defect Inspection, System, and Computer-Readable Medium
- Publication number 20230175981
- Publication date Jun 8, 2023
- Hitachi High-Tech Corporation
- Takanori KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Method and Defect Inspection Device
- Publication number 20220301136
- Publication date Sep 22, 2022
- Takashi HIROI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Program
- Publication number 20220084856
- Publication date Mar 17, 2022
- Hitachi High-Tech Corporation
- Takashi HIROI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20210381989
- Publication date Dec 9, 2021
- Hitachi High-Tech Corporation
- Takashi HIROI
- G01 - MEASURING TESTING
Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20200057003
- Publication date Feb 20, 2020
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20190206047
- Publication date Jul 4, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...
- Publication number 20190154593
- Publication date May 23, 2019
- Hitachi High-Technologies Corporation
- Takahiro URANO
- G01 - MEASURING TESTING
Information Patent Application
FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD
- Publication number 20190094155
- Publication date Mar 28, 2019
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20150369752
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20150356727
- Publication date Dec 10, 2015
- HITACHI HIGH-TECHNOLOFIES CORPORATION
- Takahiro URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20130294677
- Publication date Nov 7, 2013
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, DEFECT INSPECTION APPARATUS, PROGRAM PROD...
- Publication number 20130202188
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Takahiro URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE AND METHOD OF INSPECTING DEFECT
- Publication number 20120293795
- Publication date Nov 22, 2012
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20120229618
- Publication date Sep 13, 2012
- Takahiro Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING DEFECT
- Publication number 20120141012
- Publication date Jun 7, 2012
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING

Takahiro URANO

Person

Patents Grantslast 30 patents

Defect inspection apparatus and defect inspection program

Defect inspection method and defect inspection device

Defect inspection device and defect inspection method

Inspection information generation device, inspection information ge...

Defect inspection device and defect inspection method

Flaw inspection device and flaw inspection method

Flaw inspection device and flaw inspection method

Defect inspection method and defect inspection device

Defect inspection device and defect inspection method

Defect inspection device and defect inspection method

Defect inspection device and method of inspecting defect

Apparatus and method for inspecting defect

Patents Applicationslast 30 patents

Method for Defect Inspection, System, and Computer-Readable Medium

Defect Inspection Method and Defect Inspection Device

Defect Inspection Apparatus and Defect Inspection Program

Defect Inspection Device and Defect Inspection Method

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

INSPECTION INFORMATION GENERATION DEVICE, INSPECTION INFORMATION GE...

FLAW INSPECTION DEVICE AND FLAW INSPECTION METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

DEFECT INSPECTION METHOD, DEFECT INSPECTION APPARATUS, PROGRAM PROD...

DEFECT INSPECTION DEVICE AND METHOD OF INSPECTING DEFECT

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

APPARATUS AND METHOD FOR INSPECTING DEFECT