Takahiro YAMAKURA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Film thickness measuring device and film thickness measuring method
- Patent number 8,339,617
- Issue date Dec 25, 2012
- Nireco Corporation
- Takeo Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR MEASURING WIDTH DIRECTION END POSITION OF STRIP, APPA...
- Publication number 20130300598
- Publication date Nov 14, 2013
- Masahiro YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20110032541
- Publication date Feb 10, 2011
- NIRECO CORPORATION
- Takeo YAMADA
- G01 - MEASURING TESTING