Takahisa Kawamura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder and charged particle beam system
- Patent number 11,640,895
- Issue date May 2, 2023
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample attachment device
- Patent number 11,521,823
- Issue date Dec 6, 2022
- Jeol Ltd.
- Takahisa Kawamura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Sample Holder and Charged Particle Beam System
- Publication number 20220223368
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Attachment Device
- Publication number 20210098225
- Publication date Apr 1, 2021
- JEOL Ltd.
- Takahisa Kawamura
- H01 - BASIC ELECTRIC ELEMENTS