Membership
Tour
Register
Log in
Takahisa Tomi
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Optical characteristic measuring apparatus, method and recording me...
Patent number
6,954,263
Issue date
Oct 11, 2005
Advantest Corporation
Kenichi Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for analyzing and displaying waveform data
Patent number
5,877,620
Issue date
Mar 2, 1999
Advantest Corporation
Takahisa Tomi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical characteristic measuring apparatus, method and recording me...
Publication number
20040105089
Publication date
Jun 3, 2004
Kenichi Nakamura
G01 - MEASURING TESTING