Takahito Hashimoto

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing method, image processing system, and X-ray compute...
- Patent number 8,588,499
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Takashi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number D571385
- Issue date Jun 17, 2008
- Hitachi High-Technologies Corporation
- Mitsuru Onuma
- D16 - Photography and optical equipment
Information Patent Grant
Electric charged particle beam microscopy, electric charged particl...
- Patent number 7,372,051
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,372,029
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and scanning transmission...
- Patent number 7,227,144
- Issue date Jun 5, 2007
- Hitachi High-Technologies Corporation
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,822,233
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,531,697
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope having electrical and mechanical position contr...
- Patent number 5,008,536
- Issue date Apr 16, 1991
- Hitachi, Ltd.
- Shigeto Isakozawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Image Processing Method, Image Processing System, and X-Ray Compute...
- Publication number 20130202180
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Takashi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam system and its specimen holder
- Publication number 20080093565
- Publication date Apr 24, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20070228277
- Publication date Oct 4, 2007
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning transmission electron microscope and scanning transmission...
- Publication number 20060151701
- Publication date Jul 13, 2006
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electric charged particle beam microscopy, electric charged particl...
- Publication number 20060038125
- Publication date Feb 23, 2006
- Ruriko Tsuneta
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for scanning transmission electron microscopy
- Publication number 20030127595
- Publication date Jul 10, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Takahito Hashimoto

Person

Patents Grantslast 30 patents

Image processing method, image processing system, and X-ray compute...

Electron microscope

Electric charged particle beam microscopy, electric charged particl...

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Method and apparatus for scanning transmission electron microscopy

Method and apparatus for scanning transmission electron microscopy

Electron microscope having electrical and mechanical position contr...

Patents Applicationslast 30 patents

Image Processing Method, Image Processing System, and X-Ray Compute...

Charged particle beam system and its specimen holder

Scanning transmission electron microscope and scanning transmission...

Scanning transmission electron microscope and scanning transmission...

Electric charged particle beam microscopy, electric charged particl...

Method and apparatus for scanning transmission electron microscopy