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Takahito INOUE
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Kyoto-shi, Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Quadrupole mass spectrometer, quadrupole mass spectrometry method,...
Patent number
11,270,878
Issue date
Mar 8, 2022
Horiba Stec, Co., Ltd.
Kohei Sasai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Element analysis device and element analysis method
Patent number
10,978,285
Issue date
Apr 13, 2021
Horiba, Ltd.
Takahito Inoue
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analysis device
Patent number
10,627,355
Issue date
Apr 21, 2020
Horiba, Ltd.
Takahito Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Analysis apparatus
Patent number
10,379,017
Issue date
Aug 13, 2019
Horiba, Ltd.
Yasushi Hirata
F27 - FURNACES KILNS OVENS RETORTS
Patents Applications
last 30 patents
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Patent Application
ELEMENT ANALYSIS METHOD, ELEMENT ANALYSIS DEVICE, AND NON-TRANSITOR...
Publication number
20230221291
Publication date
Jul 13, 2023
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ELEMENTAL ANALYSIS DEVICE
Publication number
20230221292
Publication date
Jul 13, 2023
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ELEMENT ANALYSIS DEVICE, MOUNTING JIG, AND MOUNTING METHOD
Publication number
20230213419
Publication date
Jul 6, 2023
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ELEMENTAL ANALYSIS DEVICE, METHOD FOR OPERATING ELEMENTAL ANALYSIS...
Publication number
20230204550
Publication date
Jun 29, 2023
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ELEMENTAL ANALYSIS DEVICE
Publication number
20230098544
Publication date
Mar 30, 2023
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZING APPARATUS
Publication number
20220244176
Publication date
Aug 4, 2022
HORIBA, LTD.
Takahito INOUE
G01 - MEASURING TESTING
Information
Patent Application
ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD
Publication number
20210318267
Publication date
Oct 14, 2021
HORIBA, LTD.
Takahito INOUE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
QUADRUPOLE MASS SPECTROMETER, QUADRUPOLE MASS SPECTROMETRY METHOD,...
Publication number
20210166932
Publication date
Jun 3, 2021
Horiba Stec, Co., Ltd.
Kohei SASAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELEMENT ANALYSIS DEVICE AND ELEMENT ANALYSIS METHOD
Publication number
20190206667
Publication date
Jul 4, 2019
HORIBA, LTD.
Takahito INOUE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS DEVICE
Publication number
20180348153
Publication date
Dec 6, 2018
HORIBA, LTD.
Takahito INOUE
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
ANALYSIS APPARATUS
Publication number
20160266018
Publication date
Sep 15, 2016
HORIBA, LTD.
Yasushi HIRATA
G01 - MEASURING TESTING