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Takaji Ishikawa
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Connection board, probe card, and electronic device test apparatus...
Patent number
8,134,381
Issue date
Mar 13, 2012
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Grant
Contact pin probe card and electronic device test apparatus using same
Patent number
7,667,471
Issue date
Feb 23, 2010
Advantest Corporation
Fumio Kurotori
G01 - MEASURING TESTING
Information
Patent Grant
System for mating and demating multiple connectors mounted on board...
Patent number
7,484,285
Issue date
Feb 3, 2009
Advantest Corp.
Masanori Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe card and the production method
Patent number
7,482,821
Issue date
Jan 27, 2009
Advantest Corporation
Takaji Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component testing socket and electronic component testin...
Patent number
6,932,635
Issue date
Aug 23, 2005
Advantest Corporation
Takaji Ishikawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONNECTION BOARD, PROBE CARD, AND ELECTRONIC DEVICE TEST APPARATUS...
Publication number
20100102837
Publication date
Apr 29, 2010
Advantest Corporation
Yoshihiro Abe
G01 - MEASURING TESTING
Information
Patent Application
Contact Pin Probe Card and Electronic Device Test Apparatus Using Same
Publication number
20080143366
Publication date
Jun 19, 2008
Fumio Kurotori
G01 - MEASURING TESTING
Information
Patent Application
Probe card and the production method
Publication number
20050280428
Publication date
Dec 22, 2005
Takaji Ishikawa
G01 - MEASURING TESTING
Information
Patent Application
Connector connecting /disconnecting tool
Publication number
20050081372
Publication date
Apr 21, 2005
Masanori Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic component testing socket and electronic component testin...
Publication number
20040077200
Publication date
Apr 22, 2004
Takaji Ishikawa
G01 - MEASURING TESTING