Takako Onishi

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection management system, inspection management apparatuses, an...
- Patent number 11,154,001
- Issue date Oct 19, 2021
- Omron Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Inspection management system, inspection management apparatuses, an...
- Patent number 10,876,977
- Issue date Dec 29, 2020
- Omron Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 10,605,748
- Issue date Mar 31, 2020
- Omron Corporation
- Shinji Sugita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 10,545,101
- Issue date Jan 28, 2020
- Omron Corporation
- Shinji Sugita
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus and control method
- Patent number 10,054,432
- Issue date Aug 21, 2018
- Omron Corporation
- Hironori Kasahara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Board inspecting apparatus, its parameter setting method and parame...
- Patent number 7,822,261
- Issue date Oct 26, 2010
- OMRON Corporation
- Toshihiro Moriya
- G01 - MEASURING TESTING
Information Patent Grant
PC board inspecting method and apparatus and inspection logic setti...
- Patent number 7,715,616
- Issue date May 11, 2010
- Omron Corporation
- Toshihiro Moriya
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTING METHOD,...
- Publication number 20240183792
- Publication date Jun 6, 2024
- Omron Corporation
- Takako ONISHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...
- Publication number 20240062401
- Publication date Feb 22, 2024
- Omron Corporation
- Takako ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
- Publication number 20190219521
- Publication date Jul 18, 2019
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
- Publication number 20190223337
- Publication date Jul 18, 2019
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND CONTROL METHOD
- Publication number 20180080763
- Publication date Mar 22, 2018
- Omron Corporation
- Hironori KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20170356859
- Publication date Dec 14, 2017
- Omron Corporation
- Shinji SUGITA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20170356860
- Publication date Dec 14, 2017
- Omron Corporation
- Shinji SUGITA
- G01 - MEASURING TESTING
Information Patent Application
DATA STRUCTURE, LIBRARY CREATION DEVICE, ELECTRONIC DEVICE ANALYSIS...
- Publication number 20160267443
- Publication date Sep 15, 2016
- Omron Corporation
- Atsushi Hisano
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Board inspecting apparatus, its parameter setting method and parame...
- Publication number 20060291713
- Publication date Dec 28, 2006
- Omron Corporation
- Toshihiro Moriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PC board inspecting method and apparatus and inspection logic setti...
- Publication number 20060204074
- Publication date Sep 14, 2006
- Omron Corporation
- Toshihiro Moriya
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PC board inspecting apparatus, inspection logic setting method, and...
- Publication number 20060153439
- Publication date Jul 13, 2006
- Omron Corporation
- Toshihiro Moriya
- G01 - MEASURING TESTING

Takako Onishi

Person

Patents Grantslast 30 patents

Inspection management system, inspection management apparatuses, an...

Inspection management system, inspection management apparatuses, an...

X-ray inspection apparatus and X-ray inspection method

Inspection apparatus

X-ray inspection apparatus and control method

Board inspecting apparatus, its parameter setting method and parame...

PC board inspecting method and apparatus and inspection logic setti...

Patents Applicationslast 30 patents

INSPECTION SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECTING METHOD,...

MEASUREMENT SYSTEM, INSPECTION SYSTEM, MEASUREMENT DEVICE, MEASUREM...

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...

X-RAY INSPECTION APPARATUS AND CONTROL METHOD

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

INSPECTION APPARATUS

DATA STRUCTURE, LIBRARY CREATION DEVICE, ELECTRONIC DEVICE ANALYSIS...

Board inspecting apparatus, its parameter setting method and parame...

PC board inspecting method and apparatus and inspection logic setti...

PC board inspecting apparatus, inspection logic setting method, and...