Takamasa TSUBOUCHI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,970,885
- Issue date May 15, 2018
- Lasertec Corporation
- Hiroto Nozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope and inspection apparatus
- Patent number 9,013,787
- Issue date Apr 21, 2015
- Lasertec Corporation
- Haruhiko Kusunose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20150144769
- Publication date May 28, 2015
- Lasertec Corporation
- Hiroto NOZAWA
- G01 - MEASURING TESTING