Takamasa Usui

Person

Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Memory device
- Patent number 11,817,428
- Issue date Nov 14, 2023
- Kioxia Corporation
- Masayoshi Tagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 11,270,980
- Issue date Mar 8, 2022
- Kioxia Corporation
- Masayoshi Tagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Template, template component, and semiconductor device manufacturin...
- Patent number 10,879,137
- Issue date Dec 29, 2020
- TOSHIBA MEMORY CORPORATION
- Takahito Nishimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Staggered semiconductor memory device
- Patent number 10,868,029
- Issue date Dec 15, 2020
- TOSHIBA MEMORY CORPORATION
- Jun Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 10,741,527
- Issue date Aug 11, 2020
- TOSHIBA MEMORY CORPORATION
- Masayoshi Tagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 10,297,578
- Issue date May 21, 2019
- TOSHIBA MEMORY CORPORATION
- Masayoshi Tagami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,887,262
- Issue date Feb 6, 2018
- TOSHIBA MEMORY CORPORATION
- Yoshihiro Minami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device and method for manufacturin...
- Patent number 9,589,974
- Issue date Mar 7, 2017
- Kabushiki Kaisha Toshiba
- Jun Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,196,609
- Issue date Nov 24, 2015
- Kabushiki Kaisha Toshiba
- Hajime Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 8,456,186
- Issue date Jun 4, 2013
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with a barrier film
- Patent number 8,133,813
- Issue date Mar 13, 2012
- Semiconductor Technology Academic Research Center
- Junichi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 8,044,519
- Issue date Oct 25, 2011
- Kabushiki Kaisha Toshiba
- Tadayoshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with a barrier film
- Patent number 7,943,517
- Issue date May 17, 2011
- Semiconductor Technology Academic Research Center
- Junichi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,898,084
- Issue date Mar 1, 2011
- Kabushiki Kaisha Toshiba
- Takayo Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 7,888,253
- Issue date Feb 15, 2011
- Kabushiki Kaisha Toshiba
- Takamasa Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a silicide layer and a dielectric layer
- Patent number 7,875,976
- Issue date Jan 25, 2011
- Kabushiki Kaisha Toshiba
- Makoto Wada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor of dynamic random access memory and method of manufacturi...
- Patent number 7,786,523
- Issue date Aug 31, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 7,755,202
- Issue date Jul 13, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LSI wiring pattern for reduced deformation and cracking
- Patent number 7,750,473
- Issue date Jul 6, 2010
- Kabushiki Kaisha Toshiba
- Takamasa Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor of dynamic random access memory and method of manufacturi...
- Patent number 7,638,829
- Issue date Dec 29, 2009
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus including a radiator for diffusing the heat...
- Patent number 7,495,288
- Issue date Feb 24, 2009
- Kabushiki Kaisha Toshiba
- Takashi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method having capacitor and capacitor insu...
- Patent number 7,485,915
- Issue date Feb 3, 2009
- Kabushiki Kaisha Toshiba
- Hayato Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,470,609
- Issue date Dec 30, 2008
- Kabushiki Kaisha Toshiba
- Kazumichi Tsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with a barrier film which contains manganese
- Patent number 7,304,384
- Issue date Dec 4, 2007
- Semiconductor Technology Academic Research Center
- Junichi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,242,206
- Issue date Jul 10, 2007
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor apparatus including a radiator for diffusing the heat...
- Patent number 7,217,979
- Issue date May 15, 2007
- Kabushiki Kaisha Toshiba
- Takeshi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,205,664
- Issue date Apr 17, 2007
- Kabushiki Kaisha Toshiba
- Kazumichi Tsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,091,733
- Issue date Aug 15, 2006
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 7,067,897
- Issue date Jun 27, 2006
- Kabushiki Kaisha Toshiba
- Masaaki Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using insulating film of low dielectric consta...
- Patent number 7,049,701
- Issue date May 23, 2006
- Kabushiki Kaisha Toshiba
- Takamasa Usui
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20240038731
- Publication date Feb 1, 2024
- KIOXIA Corporation
- Masayoshi TAGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20220157784
- Publication date May 19, 2022
- KIOXIA Corporation
- Masayoshi TAGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20200350291
- Publication date Nov 5, 2020
- Toshiba Memory Corporation
- Masayoshi TAGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20190312012
- Publication date Oct 10, 2019
- Toshiba Memory Corporation
- Masayoshi TAGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20190296035
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Jun IIJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPLATE, TEMPLATE COMPONENT, AND SEMICONDUCTOR DEVICE MANUFACTURIN...
- Publication number 20190074230
- Publication date Mar 7, 2019
- Toshiba Memory Corporation
- Takahito NISHIMURA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
MEMORY DEVICE
- Publication number 20180261575
- Publication date Sep 13, 2018
- Toshiba Memory Corporation
- Masayoshi TAGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160247783
- Publication date Aug 25, 2016
- KABUSHIKI KAISHA TOSHIBA
- Yoshihiro MINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150076708
- Publication date Mar 19, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hajime KANEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...
- Publication number 20150069491
- Publication date Mar 12, 2015
- KABUSHIKI KAISHA TOSHIBA
- Jun IIJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH A BARRIER FILM
- Publication number 20110189849
- Publication date Aug 4, 2011
- Semiconductor Technology Academic Research Center
- Junichi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20110097890
- Publication date Apr 28, 2011
- Kabushiki Kaisha Toshiba
- Takamasa USUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20100244254
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Takayo Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR OF DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURI...
- Publication number 20100052028
- Publication date Mar 4, 2010
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20090152736
- Publication date Jun 18, 2009
- Kabushiki Kaisha Toshiba
- Tadayoshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor apparatus including a radiator for diffusing the heat...
- Publication number 20090127582
- Publication date May 21, 2009
- Kabushiki Kaisha Toshiba
- Takashi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20080246155
- Publication date Oct 9, 2008
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image recording apparatus and method for restoring recording head f...
- Publication number 20080212143
- Publication date Sep 4, 2008
- Takamasa Usui
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20080203573
- Publication date Aug 28, 2008
- Kabushiki Kaisha Toshiba
- Takamasa Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20080146015
- Publication date Jun 19, 2008
- Kabushiki Kaisha Toshiba
- Takamasa USUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20080088021
- Publication date Apr 17, 2008
- Kabushiki Kaisha Toshiba
- Makoto WADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20080054466
- Publication date Mar 6, 2008
- Kabushiki Kaisha Toshiba
- Hayato NASU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH A BARRIER FILM
- Publication number 20080057704
- Publication date Mar 6, 2008
- Semiconductor Technology Academic Research Center
- Junichi Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...
- Publication number 20080018355
- Publication date Jan 24, 2008
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20070262468
- Publication date Nov 15, 2007
- Hayato Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor apparatus including a radiator for diffusing the heat...
- Publication number 20070187830
- Publication date Aug 16, 2007
- Kabushiki Kaisha Toshiba
- Takashi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitor of dynamic random access memory and method of manufacturi...
- Publication number 20070170483
- Publication date Jul 26, 2007
- Kabushiki Kaisha Toshiba
- Yumi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20070123029
- Publication date May 31, 2007
- Kabushiki Kaisha Toshiba
- Kazumichi Tsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having MIM capacitor and manufacturing method...
- Publication number 20070012973
- Publication date Jan 18, 2007
- Kabushiki Kaisha Toshiba
- Hayato Nasu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having ferroelectric film as gate insulating f...
- Publication number 20070004049
- Publication date Jan 4, 2007
- Hayato Nasu
- H01 - BASIC ELECTRIC ELEMENTS

Takamasa Usui

Person

Patents Grantslast 30 patents

Memory device

Memory device

Template, template component, and semiconductor device manufacturin...

Staggered semiconductor memory device

Memory device

Memory device

Semiconductor device

Nonvolatile semiconductor memory device and method for manufacturin...

Semiconductor device

Reliability evaluation test apparatus, reliability evaluation test...

Semiconductor device with a barrier film

Semiconductor device and method of fabricating the same

Semiconductor device with a barrier film

Semiconductor device

Method of fabricating semiconductor device

Semiconductor device including a silicide layer and a dielectric layer

Capacitor of dynamic random access memory and method of manufacturi...

Semiconductor device and method of fabricating the same

LSI wiring pattern for reduced deformation and cracking

Capacitor of dynamic random access memory and method of manufacturi...

Semiconductor apparatus including a radiator for diffusing the heat...

Semiconductor device and method having capacitor and capacitor insu...

Semiconductor device and method for manufacturing the same

Semiconductor device with a barrier film which contains manganese

Reliability evaluation test apparatus, reliability evaluation test...

Semiconductor apparatus including a radiator for diffusing the heat...

Semiconductor device and method for manufacturing the same

Reliability evaluation test apparatus, reliability evaluation test...

Semiconductor device

Semiconductor device using insulating film of low dielectric consta...

Patents Applicationslast 30 patents

MEMORY DEVICE

MEMORY DEVICE

MEMORY DEVICE

MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE

TEMPLATE, TEMPLATE COMPONENT, AND SEMICONDUCTOR DEVICE MANUFACTURIN...

MEMORY DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURIN...

SEMICONDUCTOR DEVICE WITH A BARRIER FILM

METHOD OF FABRICATING SEMICONDUCTOR DEVICE

Semiconductor device

CAPACITOR OF DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURI...

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Semiconductor apparatus including a radiator for diffusing the heat...

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Image recording apparatus and method for restoring recording head f...

SEMICONDUCTOR DEVICE

METHOD OF FABRICATING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE WITH A BARRIER FILM

RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor apparatus including a radiator for diffusing the heat...

Capacitor of dynamic random access memory and method of manufacturi...

Semiconductor device and method for manufacturing the same

Semiconductor device having MIM capacitor and manufacturing method...

Semiconductor device having ferroelectric film as gate insulating f...