Takamitsu Takayama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature measuring device
- Patent number 6,004,031
- Issue date Dec 21, 1999
- NKK Corporation
- Takamitsu Takayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring temperature using an optical fiber
- Patent number 5,730,527
- Issue date Mar 24, 1998
- NKK Corporation
- Takamitsu Takayama
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and method of controlling coating thickness therewith
- Patent number 5,438,415
- Issue date Aug 1, 1995
- NKK Corporation
- Akira Kazama
- G01 - MEASURING TESTING