Takano Mitsuyoshi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Waveform display apparatus of frequency sweep type for facilitating...
- Patent number 5,579,463
- Issue date Nov 26, 1996
- Anritsu Corporation
- Mitsuyoshi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display apparatus for easily realizing high-definition wav...
- Patent number 5,519,820
- Issue date May 21, 1996
- Anritsu Corporation
- Takehiko Kawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer capable of displaying signals obtained during a s...
- Patent number 5,162,724
- Issue date Nov 10, 1992
- Anritsu Corporation
- Aiichi Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer having functions for simultaneously executing plu...
- Patent number 5,119,018
- Issue date Jun 2, 1992
- Anritsu Corporation
- Aiichi Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer having partially scrolling function for display screen
- Patent number 4,890,099
- Issue date Dec 26, 1989
- Anritsu Corporation
- Mitsuyoshi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer apparatus with automatic frequency measuring function
- Patent number 4,839,582
- Issue date Jun 13, 1989
- Anritsu Corporation
- Seiryo Fukaya
- G01 - MEASURING TESTING
Information Patent Grant
Signal analyzer apparatus with analog partial sweep function
- Patent number 4,839,583
- Issue date Jun 13, 1989
- Anritsu Corporation
- Mitsuyoshi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring apparatus with marker zone displaying function
- Patent number 4,801,873
- Issue date Jan 31, 1989
- Anritsu Corporation
- Mitsuyoshi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer with automatic peak frequency tuning function
- Patent number 4,611,164
- Issue date Sep 9, 1986
- Anritsu Electric Company Limited
- Takano Mitsuyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer
- Patent number 4,607,215
- Issue date Aug 19, 1986
- Anritsu Electric Co., Ltd.
- Mitsuyoshi Takano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum analyzer
- Patent number 4,578,638
- Issue date Mar 25, 1986
- Anritsu Electric Co. Ltd.
- Mitsuyoshi Takano
- G01 - MEASURING TESTING

Takano Mitsuyoshi

Person

Patents Grantslast 30 patents

Waveform display apparatus of frequency sweep type for facilitating...

Waveform display apparatus for easily realizing high-definition wav...

Spectrum analyzer capable of displaying signals obtained during a s...

Spectrum analyzer having functions for simultaneously executing plu...

Signal analyzer having partially scrolling function for display screen

Signal analyzer apparatus with automatic frequency measuring function

Signal analyzer apparatus with analog partial sweep function

Waveform measuring apparatus with marker zone displaying function

Spectrum analyzer with automatic peak frequency tuning function

Spectrum analyzer

Spectrum analyzer