Takanori Eguchi

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, semiconductor device testing method, and data...
- Patent number 8,498,831
- Issue date Jul 30, 2013
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having calibration circuit for adjusting outpu...
- Patent number 8,390,318
- Issue date Mar 5, 2013
- Elpida Memory, Inc.
- Hideyuki Yokou
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE HAVING CALIBRATION CIRCUIT FOR ADJUSTING OUTPU...
- Publication number 20120212254
- Publication date Aug 23, 2012
- Elpida Memory, Inc.
- Hideyuki YOKOU
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device, semiconductor device testing method, and data...
- Publication number 20110093224
- Publication date Apr 21, 2011
- Elpida Memory, Inc.
- Akira Ide
- G11 - INFORMATION STORAGE