Takanori Funabashi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement probe
- Patent number 11,473,904
- Issue date Oct 18, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement device probe and shape measurement device
- Patent number 7,797,851
- Issue date Sep 21, 2010
- Panasonic Corporation
- Takanori Funabashi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement probe
- Patent number 7,520,067
- Issue date Apr 21, 2009
- Panasonic Corporation
- Keiichi Yoshizumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STORAGE DEVICE AND STORAGE METHOD FOR MEASUREMENT PROBE
- Publication number 20240426589
- Publication date Dec 26, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- TOSHIO SHIBUTANI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
MEASUREMENT PROBE
- Publication number 20210123725
- Publication date Apr 29, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- KEISHI KUBO
- G01 - MEASURING TESTING
Information Patent Application
Shape measurement device probe and shape measurement device
- Publication number 20100011601
- Publication date Jan 21, 2010
- Takanori Funabashi
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional measurement probe
- Publication number 20080148588
- Publication date Jun 26, 2008
- Keiichi Yoshizumi
- G01 - MEASURING TESTING