Takanori Hyakudomi

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing system
- Patent number 11,454,664
- Issue date Sep 27, 2022
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system
- Patent number 11,360,115
- Issue date Jun 14, 2022
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and contact method
- Patent number 11,099,236
- Issue date Aug 24, 2021
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Method of contacting substrate with probe card
- Patent number 9,863,977
- Issue date Jan 9, 2018
- Tokyo Electron Limited
- Kunihiro Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection apparatus, and control program for pe...
- Patent number 7,679,387
- Issue date Mar 16, 2010
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus and positional deviation acquiring method
- Patent number 7,477,064
- Issue date Jan 13, 2009
- Tokyo Electron Limited
- Daiki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Detection method/device of probe's tip location using a transparent...
- Patent number 7,397,257
- Issue date Jul 8, 2008
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus with optical length-measuring unit and probe testin...
- Patent number 7,221,177
- Issue date May 22, 2007
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING SYSTEM
- Publication number 20210333319
- Publication date Oct 28, 2021
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE AND CONTACT METHOD
- Publication number 20200033404
- Publication date Jan 30, 2020
- Takanori HYAKUDOMI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20190265272
- Publication date Aug 29, 2019
- TOKYO ELECTRON LIMITED
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTACTING SUBSTRATE WITH PROBE CARD
- Publication number 20150219687
- Publication date Aug 6, 2015
- TOKYO ELECTRON LIMITED
- Kunihiro Furuya
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method, Inspection Apparatus and Control Program
- Publication number 20090002008
- Publication date Jan 1, 2009
- TOKYO ELECTRON LIMITED
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD OF PROBE'S TIP LOCATION, STORAGE MEDIUM STORING TH...
- Publication number 20070229098
- Publication date Oct 4, 2007
- TOKYO ELECTRON LIMITED
- Masahito KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Probing apparatus and positional deviation acquiring method
- Publication number 20060238905
- Publication date Oct 26, 2006
- TOKYO ELECTRON LIMITED
- Daiki Kurihara
- G01 - MEASURING TESTING
Information Patent Application
Probe apparatus with optical length-measuring unit and probe testin...
- Publication number 20050253613
- Publication date Nov 17, 2005
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING

Takanori Hyakudomi

Person

Patents Grantslast 30 patents

Testing system

Inspection system

Inspection device and contact method

Method of contacting substrate with probe card

Inspection method, inspection apparatus, and control program for pe...

Probing apparatus and positional deviation acquiring method

Detection method/device of probe's tip location using a transparent...

Probe apparatus with optical length-measuring unit and probe testin...

Patents Applicationslast 30 patents

TESTING SYSTEM

DETECTION DEVICE AND CONTACT METHOD

INSPECTION SYSTEM

METHOD OF CONTACTING SUBSTRATE WITH PROBE CARD

Inspection Method, Inspection Apparatus and Control Program

DETECTION METHOD OF PROBE'S TIP LOCATION, STORAGE MEDIUM STORING TH...

Probing apparatus and positional deviation acquiring method

Probe apparatus with optical length-measuring unit and probe testin...