Takanori Murano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray measurement apparatus and X-ray measurement method
- Patent number 11,788,976
- Issue date Oct 17, 2023
- Jeol Ltd.
- Takanori Murano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detection apparatus and method
- Patent number 11,699,567
- Issue date Jul 11, 2023
- Jeol Ltd.
- Takanori Murano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,674,913
- Issue date Jun 13, 2023
- Jeol Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,668,662
- Issue date Jun 6, 2023
- Jeol Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and spectrum generation method
- Patent number 11,353,414
- Issue date Jun 7, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and analysis device
- Patent number 11,131,638
- Issue date Sep 28, 2021
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer and spectrum generation method
- Patent number 10,739,284
- Issue date Aug 11, 2020
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection system
- Patent number 8,421,007
- Issue date Apr 16, 2013
- TOHOKU UNIVERSITY
- Masami Terauchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spectrum Analysis Apparatus and Database Creation Method
- Publication number 20220307996
- Publication date Sep 29, 2022
- JEOL Ltd.
- Shogo Koshiya
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Spectrum Analysis Apparatus and Method
- Publication number 20220299457
- Publication date Sep 22, 2022
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection Apparatus and Method
- Publication number 20220172923
- Publication date Jun 2, 2022
- JEOL Ltd.
- Takanori Murano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-Ray Measurement Apparatus and X-Ray Measurement Method
- Publication number 20220146442
- Publication date May 12, 2022
- JEOL Ltd.
- Takanori Murano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026377
- Publication date Jan 27, 2022
- JEOL Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026378
- Publication date Jan 27, 2022
- JEOL Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
Analytical Method and Apparatus
- Publication number 20210302339
- Publication date Sep 30, 2021
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Spectrum Generation Method
- Publication number 20200284739
- Publication date Sep 10, 2020
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Analysis Device
- Publication number 20200191733
- Publication date Jun 18, 2020
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Analyzer and Spectrum Generation Method
- Publication number 20190049396
- Publication date Feb 14, 2019
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection System
- Publication number 20120292508
- Publication date Nov 22, 2012
- JEOL Ltd.
- Masami Terauchi
- G01 - MEASURING TESTING

Takanori Murano

Person

Patents Grantslast 30 patents

X-ray measurement apparatus and X-ray measurement method

X-ray detection apparatus and method

Sample analysis apparatus and method

Sample analysis apparatus and method

Analytical method and apparatus

Analysis device and spectrum generation method

Calibration method and analysis device

X-ray analyzer and spectrum generation method

X-ray detection system

Patents Applicationslast 30 patents

Analyzing Method and Analyzer

Spectrum Analysis Apparatus and Database Creation Method

X-Ray Spectrum Analysis Apparatus and Method

X-Ray Detection Apparatus and Method

X-Ray Measurement Apparatus and X-Ray Measurement Method

Sample Analysis Apparatus and Method

Sample Analysis Apparatus and Method

Analytical Method and Apparatus

Analysis Device and Spectrum Generation Method

Calibration Method and Analysis Device

X-Ray Analyzer and Spectrum Generation Method

X-Ray Detection System