Takanori Ninomiya

Person

Goten 1-30-21, Hiratsuka-shi, Kanagawa-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Power module, power converter device, and electrically powered vehicle
- Patent number 11,139,748
- Issue date Oct 5, 2021
- Hitachi Astemo, Ltd.
- Kinya Nakatsu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power module, power converter device, and electrically powered vehicle
- Patent number 10,348,214
- Issue date Jul 9, 2019
- Hitachi Automotive Systems, Ltd.
- Kinya Nakatsu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power module, power converter device, and electrically powered vehicle
- Patent number 9,729,076
- Issue date Aug 8, 2017
- Hitachi Automotive Systems, Ltd.
- Kinya Nakatsu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power module, power converter device, and electrically powered vehicle
- Patent number 9,407,163
- Issue date Aug 2, 2016
- Hitachi Automotive Systems, Ltd.
- Kinya Nakatsu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Power module, power converter device, and electrically powered vehicle
- Patent number 8,946,567
- Issue date Feb 3, 2015
- Hitachi Automotive Systems, Ltd.
- Kinya Nakatsu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,559,000
- Issue date Oct 15, 2013
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,274,651
- Issue date Sep 25, 2012
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 8,040,503
- Issue date Oct 18, 2011
- Hitachi, Ltd.
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the morphology of an occupant in an automoti...
- Patent number 7,987,033
- Issue date Jul 26, 2011
- Hitachi Computer Products (Europe) S.A.S.
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method using capacitive sensors for morphology discrimination of a...
- Patent number 7,962,311
- Issue date Jun 14, 2011
- Hitachi Computer Products (Europe) S.A.S.
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of detecting defects on an object
- Patent number 7,940,383
- Issue date May 10, 2011
- Hitachi, Ltd.
- Minori Noguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for improving the localisation of a target in regard of a se...
- Patent number 7,895,014
- Issue date Feb 22, 2011
- Hitachi Computer Products (Europe) S.A.S.
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,692,779
- Issue date Apr 6, 2010
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 7,643,138
- Issue date Jan 5, 2010
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,639,350
- Issue date Dec 29, 2009
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
NMR probe and NMR spectrometer
- Patent number 7,619,414
- Issue date Nov 17, 2009
- Hitachi, Ltd.
- Hiroyuki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,558,683
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,443,496
- Issue date Oct 28, 2008
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 7,417,723
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
- Patent number 7,397,031
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,305,314
- Issue date Dec 4, 2007
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting method and apparatus thereof, and pattern inspec...
- Patent number 7,263,216
- Issue date Aug 28, 2007
- Hitachi, Ltd.
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a circuit pattern and inspecting instrument
- Patent number 7,098,455
- Issue date Aug 29, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,098,055
- Issue date Aug 29, 2006
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 7,061,602
- Issue date Jun 13, 2006
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,037,735
- Issue date May 2, 2006
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 7,010,447
- Issue date Mar 7, 2006
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a semiconductor device and an apparatus thereof
- Patent number 6,888,959
- Issue date May 3, 2005
- Hitachi, Ltd.
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thin film thickness measuring method and apparatus, and method and...
- Patent number 6,806,970
- Issue date Oct 19, 2004
- Hitachi, Ltd.
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting defect and system therefor
- Patent number 6,792,359
- Issue date Sep 14, 2004
- Hitachi, Ltd.
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Power Module, Power Converter Device, and Electrically Powered Vehicle
- Publication number 20190393799
- Publication date Dec 26, 2019
- Hitachi Automotive Systems, Ltd.
- Kinya NAKATSU
- B60 - VEHICLES IN GENERAL
Information Patent Application
Power Module, Power Converter Device, and Electrically Powered Vehicle
- Publication number 20170302191
- Publication date Oct 19, 2017
- Hitachi Automotive Systems, Ltd.
- Kinya NAKATSU
- B60 - VEHICLES IN GENERAL
Information Patent Application
Power Module, Power Converter Device, and Electrically Powered Vehicle
- Publication number 20160308456
- Publication date Oct 20, 2016
- Hitachi Automotive Systems, Ltd.
- Kinya NAKATSU
- B60 - VEHICLES IN GENERAL
Information Patent Application
Power Module, Power Converter Device, and Electrically Powered Vehicle
- Publication number 20160149512
- Publication date May 26, 2016
- Hitachi Automotive Systems, Ltd.
- Kinya NAKATSU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CONSUMER ENERGY MANAGEMENT SYSTEM AND CONSUMER ENERGY MANAGEMENT ME...
- Publication number 20140316599
- Publication date Oct 23, 2014
- Hitachi, Ltd
- Yasushi Tomita
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120312104
- Publication date Dec 13, 2012
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20120006131
- Publication date Jan 12, 2012
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Power Module, Power Converter Device, and Electrically Powered Vehicle
- Publication number 20110299265
- Publication date Dec 8, 2011
- Kinya Nakatsu
- B60 - VEHICLES IN GENERAL
Information Patent Application
Apparatus And Method For Testing Defects
- Publication number 20100088042
- Publication date Apr 8, 2010
- Minori NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Method for determining the morphology of an occupant in an automoti...
- Publication number 20090088929
- Publication date Apr 2, 2009
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF
- Publication number 20080291437
- Publication date Nov 27, 2008
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NMR PROBE AND NMR SPECTROMETER
- Publication number 20080111548
- Publication date May 15, 2008
- Hiroyuki Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20080059083
- Publication date Mar 6, 2008
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for improving the localisation of a target in regard of a se...
- Publication number 20080033691
- Publication date Feb 7, 2008
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Application
Method using capacitive sensors for morphology discrimination of a...
- Publication number 20080021650
- Publication date Jan 24, 2008
- Claude Launay
- B60 - VEHICLES IN GENERAL
Information Patent Application
APPARATUS AND METHOD FOR TESTING DEFECTS
- Publication number 20070146696
- Publication date Jun 28, 2007
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING DEFECTS
- Publication number 20070146697
- Publication date Jun 28, 2007
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting a circuit pattern and inspecting instrument
- Publication number 20060243908
- Publication date Nov 2, 2006
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting a semiconductor device and an apparatus thereof
- Publication number 20060215153
- Publication date Sep 28, 2006
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20060100804
- Publication date May 11, 2006
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20060030060
- Publication date Feb 9, 2006
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20060030059
- Publication date Feb 9, 2006
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting a semiconductor device and an apparatus thereof
- Publication number 20050196033
- Publication date Sep 8, 2005
- Akira Hamamatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Information media using information of defect in an article
- Publication number 20050041836
- Publication date Feb 24, 2005
- Hitachi, Ltd.
- Kazuo Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for inspecting defect and system therefor
- Publication number 20040260496
- Publication date Dec 23, 2004
- Takanori Ninomiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspecting method and apparatus thereof, and pattern inspec...
- Publication number 20040086170
- Publication date May 6, 2004
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting a circuit pattern and inspecting instrument
- Publication number 20030201391
- Publication date Oct 30, 2003
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20020168787
- Publication date Nov 14, 2002
- Minori Noguchi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Apparatus and method for inspecting defects
- Publication number 20020154297
- Publication date Oct 24, 2002
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor manufacturing methods, plasma processing methods and...
- Publication number 20020094685
- Publication date Jul 18, 2002
- Toshihiko Nakata
- G01 - MEASURING TESTING

Takanori Ninomiya

Person

Patents Grantslast 30 patents

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

Power module, power converter device, and electrically powered vehicle

Method of inspecting a semiconductor device and an apparatus thereof

Method of inspecting a semiconductor device and an apparatus thereof

Method of inspecting a semiconductor device and an apparatus thereof

Method for determining the morphology of an occupant in an automoti...

Method using capacitive sensors for morphology discrimination of a...

Method of detecting defects on an object

Method for improving the localisation of a target in regard of a se...

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

Apparatus and method for testing defects

NMR probe and NMR spectrometer

Method for inspecting defect and system therefor

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

Method of inspecting a circuit pattern and inspecting instrument

Method for inspecting defect and system therefor

Pattern inspecting method and apparatus thereof, and pattern inspec...

Method of inspecting a circuit pattern and inspecting instrument

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

Apparatus and method for testing defects

Method for inspecting defect and system therefor

Method of inspecting a semiconductor device and an apparatus thereof

Thin film thickness measuring method and apparatus, and method and...

Method for inspecting defect and system therefor

Patents Applicationslast 30 patents

Power Module, Power Converter Device, and Electrically Powered Vehicle

Power Module, Power Converter Device, and Electrically Powered Vehicle

Power Module, Power Converter Device, and Electrically Powered Vehicle

Power Module, Power Converter Device, and Electrically Powered Vehicle

CONSUMER ENERGY MANAGEMENT SYSTEM AND CONSUMER ENERGY MANAGEMENT ME...

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

Power Module, Power Converter Device, and Electrically Powered Vehicle

Apparatus And Method For Testing Defects

Method for determining the morphology of an occupant in an automoti...

METHOD OF INSPECTING A SEMICONDUCTOR DEVICE AND AN APPARATUS THEREOF

NMR PROBE AND NMR SPECTROMETER

Method for inspecting defect and system therefor

Method for improving the localisation of a target in regard of a se...

Method using capacitive sensors for morphology discrimination of a...

APPARATUS AND METHOD FOR TESTING DEFECTS

APPARATUS AND METHOD FOR TESTING DEFECTS

Method of inspecting a circuit pattern and inspecting instrument

Method of inspecting a semiconductor device and an apparatus thereof

Method for inspecting defect and system therefor

Apparatus and method for testing defects

Apparatus and method for testing defects

Method of inspecting a semiconductor device and an apparatus thereof

Information media using information of defect in an article

Method for inspecting defect and system therefor

Pattern inspecting method and apparatus thereof, and pattern inspec...

Method of inspecting a circuit pattern and inspecting instrument

Apparatus and method for testing defects

Apparatus and method for inspecting defects

Semiconductor manufacturing methods, plasma processing methods and...