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Takanori Okita
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Image pick-up inspection equipment and method
Patent number
7,627,241
Issue date
Dec 1, 2009
Renesas Technology Corp.
Takanori Okita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20090127315
Publication date
May 21, 2009
RENESAS TECHNOLOGY CORP.
Takanori Okita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Image pick-up inspection equipment and method
Publication number
20060170911
Publication date
Aug 3, 2006
Renesas Technology Corp.
Takanori Okita
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic bonding apparatus and method
Publication number
20050194423
Publication date
Sep 8, 2005
Renesas Technology Corp.
Takanori Okita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Die bonding apparatus and method of die bonding with the apparatus
Publication number
20040121513
Publication date
Jun 24, 2004
Renesas Technology Corp.
Katsuhiro Taguchi
H01 - BASIC ELECTRIC ELEMENTS