Takanori SAWADA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis system
- Patent number 11,796,553
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,231,432
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroki Akase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210293841
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko SASAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190369131
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Hiroki AKASE
- G01 - MEASURING TESTING