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Takao Kawahara
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Tokyo, JP
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last 30 patents
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Patent Grant
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Patent number
8,988,089
Issue date
Mar 24, 2015
Advantest Corporation
Takao Kawahara
G01 - MEASURING TESTING
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Patent Grant
Pin card
Patent number
8,547,124
Issue date
Oct 1, 2013
Advantest Corporation
Takao Kawahara
G01 - MEASURING TESTING
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Patent Grant
Device, method, and program for determining element, recording medi...
Patent number
8,203,347
Issue date
Jun 19, 2012
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PIN CARD AND TEST APPARATUS USING THE SAME
Publication number
20120019272
Publication date
Jan 26, 2012
Advantest Corporation
Takao Kawahara
G01 - MEASURING TESTING
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Patent Application
PIN CARD AND TEST APPARATUS USING THE SAME
Publication number
20110291682
Publication date
Dec 1, 2011
Advantest Corporation
Takao Kawahara
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, METHOD, AND PROGRAM FOR DETERMINING ELEMENT, RECORDING MEDI...
Publication number
20100042347
Publication date
Feb 18, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING