Takao Kinefuchi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray thin film inspection apparatus and thin film inspection appar...
- Patent number 7,258,485
- Issue date Aug 21, 2007
- Rigaku Corporation
- Asao Nakano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-ray thin film inspection apparatus and thin film inspection appar...
- Publication number 20060088139
- Publication date Apr 27, 2006
- Rigaku Corporation
- Asao Nakano
- G01 - MEASURING TESTING