Takao Marui

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Hadano-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray generator and X-ray analyzer
- Patent number 10,278,273
- Issue date Apr 30, 2019
- Shimadzu Corporation
- Takao Marui
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 9,835,571
- Issue date Dec 5, 2017
- Shimadzu Corporation
- Tetsuya Yoneda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning reflection electron diffraction microscope
- Patent number 5,675,148
- Issue date Oct 7, 1997
- Shimadzu Corporation
- Takao Marui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for diffracted electrons
- Patent number 5,387,794
- Issue date Feb 7, 1995
- Shimadzu Corporation
- Takao Marui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion scattering spectroscope
- Patent number 5,371,366
- Issue date Dec 6, 1994
- Shimadzu Corporation
- Takao Marui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY GENERATOR AND X-RAY ANALYZER
- Publication number 20180007768
- Publication date Jan 4, 2018
- Shimadzu Corporation
- Takao MARUI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20170097309
- Publication date Apr 6, 2017
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer
- Publication number 20030133536
- Publication date Jul 17, 2003
- SHIMADZU CORPORATION
- Shoji Kuwabara
- G01 - MEASURING TESTING