Takao Matsumoto

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Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic electron microscope
- Patent number 7,518,111
- Issue date Apr 14, 2009
- Hitachi, Ltd.
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning interference electron microscope
- Patent number 7,417,227
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-fabrication method and equipment thereby
- Patent number 6,387,851
- Issue date May 14, 2002
- Hitachi, Ltd.
- Takao Matsumoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Phase-contrast electron microscope and phase plate therefor
- Patent number 5,814,815
- Issue date Sep 29, 1998
- Hitachi, Ltd.
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC ELECTRON MICROSCOPE
- Publication number 20090078869
- Publication date Mar 26, 2009
- Takao Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20080283748
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning interference electron microscope
- Publication number 20060124850
- Publication date Jun 15, 2006
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Micro-fabrication method and equipment thereby
- Publication number 20020082172
- Publication date Jun 27, 2002
- Takao Matsumoto
- B82 - NANO-TECHNOLOGY