Takao Murayama

Follow

Person

Kumagaya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Device testing apparatus and test method
- Patent number 6,313,654
- Issue date Nov 6, 2001
- Advantest Corporation
- Yuichi Nansai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device transporting and handling apparatus
- Patent number 6,019,564
- Issue date Feb 1, 2000
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING