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Takao Namae
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Tokyo, JP
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last 30 patents
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Patent Grant
Method and apparatus for correcting astigmatism in a scanning elect...
Patent number
4,214,163
Issue date
Jul 22, 1980
Nihon Denshi Kabushiki Kaisha
Takao Namae
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for automatically focusing an electron beam in...
Patent number
4,199,681
Issue date
Apr 22, 1980
Nihon Denshi Kabushiki Kaisha
Takao Namae
H01 - BASIC ELECTRIC ELEMENTS