Takao Ohara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus
- Patent number 9,618,461
- Issue date Apr 11, 2017
- Rigaku Corporation
- Takao Ohara
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 7,711,091
- Issue date May 4, 2010
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection device and image inspection method using the image...
- Patent number 7,569,822
- Issue date Aug 4, 2009
- Mitsubishi Electric Corporation
- Hirohisa Nishino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20140105368
- Publication date Apr 17, 2014
- Rigaku Corporation
- Takao OHARA
- G01 - MEASURING TESTING
Information Patent Application
X-ray analysis apparatus
- Publication number 20080056452
- Publication date Mar 6, 2008
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Image inspection device and image inspection method using the image...
- Publication number 20070257192
- Publication date Nov 8, 2007
- Mitsubishi Electric Corporation
- Hirohisa Nishino
- G01 - MEASURING TESTING