Takao Ohnishi

Person

Nishikasugai-Gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electrode embedded ceramic structure
- Patent number 12,174,051
- Issue date Dec 24, 2024
- NGK Insulators, Ltd.
- Takao Ohnishi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Method for manufacturing ceramic device
- Patent number 9,505,201
- Issue date Nov 29, 2016
- NGK Insulators, Ltd.
- Masayuki Uetani
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Method for manufacturing piezoelectric element
- Patent number 9,246,081
- Issue date Jan 26, 2016
- NGK Insulators, Ltd.
- Takao Ohnishi
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Method of manufacturing piezoelectric element
- Patent number 9,240,544
- Issue date Jan 19, 2016
- NGK Insulators, Ltd.
- Takao Ohnishi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Manufacturing method for thin board-shaped fired piezoelectric body
- Patent number 9,190,604
- Issue date Nov 17, 2015
- NGK Insulators, Ltd.
- Nobuo Takahashi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Piezoelectric element with electrodes allowing substrate strain and...
- Patent number 9,142,750
- Issue date Sep 22, 2015
- NGK Insulators, Ltd.
- Takao Ohnishi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for adjusting piezoelectric/electrostrictive device
- Patent number 8,680,742
- Issue date Mar 25, 2014
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for piezoelectric/electrostrictive device
- Patent number 8,664,828
- Issue date Mar 4, 2014
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Passage detection apparatus of object
- Patent number 8,528,408
- Issue date Sep 10, 2013
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric/electrostrictive element having a specific coverage a...
- Patent number 8,476,805
- Issue date Jul 2, 2013
- NGK Insulators, Ltd.
- Takao Ohnishi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for manufacturing piezoelectric actuator
- Patent number 8,375,538
- Issue date Feb 19, 2013
- NGK Insulators, Ltd.
- Hideki Shimizu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for testing piezoelectric/electrostrictive device, testing a...
- Patent number 8,304,961
- Issue date Nov 6, 2012
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric/electrostriction element manufacturing method
- Patent number 8,291,558
- Issue date Oct 23, 2012
- NGK Insulators, Ltd.
- Takao Ohnishi
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Passage detection apparatus of object
- Patent number 8,100,013
- Issue date Jan 24, 2012
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric/electrostrictive membrane sensor
- Patent number 7,876,023
- Issue date Jan 25, 2011
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric/electrostrictive membrane type measuring device
- Patent number 7,812,506
- Issue date Oct 12, 2010
- NGK Insulators, Ltd.
- Hideki Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric element and shape of an elecrode thereof
- Patent number 7,755,253
- Issue date Jul 13, 2010
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric/electrostrictive membrane sensor
- Patent number 7,714,480
- Issue date May 11, 2010
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Passage detection apparatus of object
- Patent number 7,707,887
- Issue date May 4, 2010
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Passage detection apparatus of object
- Patent number 7,681,451
- Issue date Mar 23, 2010
- NGK Insulators, Ltd.
- Shuhei Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing microarray
- Patent number 7,667,194
- Issue date Feb 23, 2010
- NGK Insulators, Ltd.
- Motoo Noritake
- G01 - MEASURING TESTING
Information Patent Grant
Flight state detection apparatus of micro object and flight state d...
- Patent number 7,615,911
- Issue date Nov 10, 2009
- NGK Insulators, Ltd.
- Kunihiko Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Liquid drop discharge piezoelectric device
- Patent number 7,588,322
- Issue date Sep 15, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Inspection method, inspection apparatus, and polarization method fo...
- Patent number 7,525,324
- Issue date Apr 28, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Biochip
- Patent number 7,442,502
- Issue date Oct 28, 2008
- NGK Insulators, Ltd.
- Toshikazu Hirota
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Piezoelectric/electrostrictive film element
- Patent number 7,427,820
- Issue date Sep 23, 2008
- NGK Insulators, Ltd.
- Kunihiko Yoshioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Biochip and method for producing the same
- Patent number 7,407,746
- Issue date Aug 5, 2008
- NGK Insulators, Ltd.
- Toshikazu Hirota
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Manufacturing method of piezoelectric/electrostrictive film type de...
- Patent number 7,267,840
- Issue date Sep 11, 2007
- NGK Insulators, Ltd.
- Takao Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid drop emitter
- Patent number 7,261,862
- Issue date Aug 28, 2007
- NGK Insulators, Ltd.
- Motoo Noritake
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing biochips
- Patent number 7,160,512
- Issue date Jan 9, 2007
- NGK Insulators, Ltd.
- Toshikazu Hirota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONDUCTIVITY MEASUREMENT METHOD
- Publication number 20250035574
- Publication date Jan 30, 2025
- NGK Insulators, Ltd.
- Akifumi MORISHITA
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVITY MEASUREMENT METHOD
- Publication number 20250035575
- Publication date Jan 30, 2025
- NGK Insulators, Ltd.
- Akifumi MORISHITA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT INSPECTION METHOD
- Publication number 20240012038
- Publication date Jan 11, 2024
- NGK Insulators, Ltd.
- Ryusuke IKEDA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE-EMBEDDED CERAMIC STRUCTURE
- Publication number 20220232672
- Publication date Jul 21, 2022
- NGK Insulators, Ltd.
- Takao OHNISHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRODE EMBEDDED CERAMIC STRUCTURE
- Publication number 20220214204
- Publication date Jul 7, 2022
- NGK Insulators, Ltd.
- Takao OHNISHI
- B32 - LAYERED PRODUCTS
Information Patent Application
ELECTRODE EMBEDDED CERAMIC STRUCTURE
- Publication number 20220214205
- Publication date Jul 7, 2022
- NGK Insulators, Ltd.
- Takao OHNISHI
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
METHOD FOR MANUFACTURING CERAMIC DEVICE
- Publication number 20140027053
- Publication date Jan 30, 2014
- NGK Insulators, Ltd.
- Masayuki UETANI
- B32 - LAYERED PRODUCTS
Information Patent Application
PIEZOELECTRIC ELEMENT AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130214647
- Publication date Aug 22, 2013
- NGK Insulators, Ltd.
- Takao OHNISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ADJUSTING PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE
- Publication number 20130093291
- Publication date Apr 18, 2013
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE
- Publication number 20130033266
- Publication date Feb 7, 2013
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PIEZOELECTRIC ELEMENT
- Publication number 20120117769
- Publication date May 17, 2012
- NGK Insulators, Ltd.
- Takao OHNISHI
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
PASSAGE DETECTION APPARATUS OF OBJECT
- Publication number 20120060608
- Publication date Mar 15, 2012
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD FOR THIN BOARD-SHAPED FIRED PIEZOELECTRIC BODY
- Publication number 20120030916
- Publication date Feb 9, 2012
- NGK Insulators, Ltd.
- Nobuo Takahashi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
METHOD OF MANUFACTURING PIEZOELECTRIC ELEMENT
- Publication number 20110289744
- Publication date Dec 1, 2011
- NGK Insulators, Ltd.
- Takao Ohnishi
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
METHOD FOR TESTING PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE, TESTING A...
- Publication number 20110025171
- Publication date Feb 3, 2011
- NGK Insulators, Ltd.
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PIEZOELECTRIC ACTUATOR
- Publication number 20100242242
- Publication date Sep 30, 2010
- NGK Insulators, Ltd.
- Hideki SHIMIZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIEZOELECTRIC/ELECTROSTRICTIVE ELEMENT AND MANUFACTURING METHOD OF...
- Publication number 20100187953
- Publication date Jul 29, 2010
- NGK Insulators, Ltd.
- Takao Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSAGE DETECTION APPARATUS OF OBJECT
- Publication number 20100148803
- Publication date Jun 17, 2010
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FO...
- Publication number 20090174419
- Publication date Jul 9, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Piezoelectric/electrostrictive membrane sensor
- Publication number 20090120183
- Publication date May 14, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
Piezoelectric/electrostrictive membrane sensor
- Publication number 20090102321
- Publication date Apr 23, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC/ELECTROSTRICTIVE MEMBRANE TYPE SENSOR
- Publication number 20090095072
- Publication date Apr 16, 2009
- NGK Insulators, Ltd.
- Hideki Shimizu
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC/ELECTROSTRICTIVE FILM ELEMENT
- Publication number 20090072667
- Publication date Mar 19, 2009
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
Test Piece for Analysis
- Publication number 20080267821
- Publication date Oct 30, 2008
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
PASSAGE DETECTION APPARATUS OF OBJECT
- Publication number 20080122455
- Publication date May 29, 2008
- NGK Insulators, Ltd.
- Takao Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC/ELECTROSTRICTIVE FILM ELEMENT
- Publication number 20080111453
- Publication date May 15, 2008
- NGK Insulators, Ltd.
- Kunihiko YOSHIOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIEZOELECTRIC/ELECTROSTRICTION ELEMENT MANUFACTURING METHOD
- Publication number 20080098582
- Publication date May 1, 2008
- NGK Insulators, Ltd.
- Takao OHNISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSAGE DETECTION APPARATUS OF OBJECT
- Publication number 20080047349
- Publication date Feb 28, 2008
- NGK Insulators, Ltd.
- Shuhei Fujita
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FO...
- Publication number 20080030102
- Publication date Feb 7, 2008
- NGK Insulators, Ltd.
- Takao Ohnishi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Manufacturing method of piezoelectric/electrostrictive device
- Publication number 20070220724
- Publication date Sep 27, 2007
- NGK Insulators, Ltd.
- Takao Ohnishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Takao Ohnishi

Person

Patents Grantslast 30 patents

Electrode embedded ceramic structure

Method for manufacturing ceramic device

Method for manufacturing piezoelectric element

Method of manufacturing piezoelectric element

Manufacturing method for thin board-shaped fired piezoelectric body

Piezoelectric element with electrodes allowing substrate strain and...

Method for adjusting piezoelectric/electrostrictive device

Testing apparatus for piezoelectric/electrostrictive device

Passage detection apparatus of object

Piezoelectric/electrostrictive element having a specific coverage a...

Method for manufacturing piezoelectric actuator

Method for testing piezoelectric/electrostrictive device, testing a...

Piezoelectric/electrostriction element manufacturing method

Passage detection apparatus of object

Piezoelectric/electrostrictive membrane sensor

Piezoelectric/electrostrictive membrane type measuring device

Piezoelectric element and shape of an elecrode thereof

Piezoelectric/electrostrictive membrane sensor

Passage detection apparatus of object

Passage detection apparatus of object

Method of producing microarray

Flight state detection apparatus of micro object and flight state d...

Liquid drop discharge piezoelectric device

Inspection method, inspection apparatus, and polarization method fo...

Biochip

Piezoelectric/electrostrictive film element

Biochip and method for producing the same

Manufacturing method of piezoelectric/electrostrictive film type de...

Liquid drop emitter

Method for manufacturing biochips

Patents Applicationslast 30 patents

CONDUCTIVITY MEASUREMENT METHOD

CONDUCTIVITY MEASUREMENT METHOD

ELECTRONIC COMPONENT INSPECTION METHOD

ELECTRODE-EMBEDDED CERAMIC STRUCTURE

ELECTRODE EMBEDDED CERAMIC STRUCTURE

ELECTRODE EMBEDDED CERAMIC STRUCTURE

METHOD FOR MANUFACTURING CERAMIC DEVICE

PIEZOELECTRIC ELEMENT AND METHOD FOR MANUFACTURING THE SAME

METHOD FOR ADJUSTING PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE

TESTING APPARATUS FOR PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE

METHOD FOR MANUFACTURING PIEZOELECTRIC ELEMENT

PASSAGE DETECTION APPARATUS OF OBJECT

MANUFACTURING METHOD FOR THIN BOARD-SHAPED FIRED PIEZOELECTRIC BODY

METHOD OF MANUFACTURING PIEZOELECTRIC ELEMENT

METHOD FOR TESTING PIEZOELECTRIC/ELECTROSTRICTIVE DEVICE, TESTING A...

METHOD FOR MANUFACTURING PIEZOELECTRIC ACTUATOR

PIEZOELECTRIC/ELECTROSTRICTIVE ELEMENT AND MANUFACTURING METHOD OF...

PASSAGE DETECTION APPARATUS OF OBJECT

INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FO...

Piezoelectric/electrostrictive membrane sensor

Piezoelectric/electrostrictive membrane sensor

PIEZOELECTRIC/ELECTROSTRICTIVE MEMBRANE TYPE SENSOR

PIEZOELECTRIC/ELECTROSTRICTIVE FILM ELEMENT

Test Piece for Analysis

PASSAGE DETECTION APPARATUS OF OBJECT

PIEZOELECTRIC/ELECTROSTRICTIVE FILM ELEMENT

PIEZOELECTRIC/ELECTROSTRICTION ELEMENT MANUFACTURING METHOD

PASSAGE DETECTION APPARATUS OF OBJECT

INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FO...

Manufacturing method of piezoelectric/electrostrictive device