Takao Okada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Aviation system
- Patent number 12,072,364
- Issue date Aug 27, 2024
- SUBARU CORPORATION
- Hiroyuki Tsubata
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection system
- Patent number 10,408,766
- Issue date Sep 10, 2019
- Bosch Packaging Technology K.K.
- Takao Okada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Air cleaning filter, process for preparing the same, and high-level...
- Patent number 6,352,578
- Issue date Mar 5, 2002
- Takasago Thermal Engineering Co., Ltd.
- Soichiro Sakata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method for detecting a hybridized nucleic acid molecule
- Patent number 6,194,148
- Issue date Feb 27, 2001
- Olympus Optical Co., Ltd.
- Kunio Hori
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Air cleaning apparatus, air filter and method for manufacturing the...
- Patent number 6,120,584
- Issue date Sep 19, 2000
- Takasago Thermal Engineering Co., Ltd.
- Soichiro Sakata
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Atomic probe microscope
- Patent number 5,394,741
- Issue date Mar 7, 1995
- Olympus Optical Co., Ltd.
- Hiroshi Kajimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,378,983
- Issue date Jan 3, 1995
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,296,704
- Issue date Mar 22, 1994
- Olympus Optical Co., Ltd.
- Shuzo Mishima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having cantilever and detecting sample ch...
- Patent number 5,289,004
- Issue date Feb 22, 1994
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
STM memory medium
- Patent number 5,266,502
- Issue date Nov 30, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope
- Patent number 5,260,824
- Issue date Nov 9, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic probe microscope
- Patent number 5,245,863
- Issue date Sep 21, 1993
- Olympus Optical Co., Ltd.
- Hiroshi Kajimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Lithography apparatus using scanning tunneling microscopy
- Patent number 5,227,626
- Issue date Jul 13, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for a scanning tunneling microscope
- Patent number D335888
- Issue date May 25, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- D16 - Photography and optical equipment
Information Patent Grant
Technique for canceling the effect of external vibration on an atom...
- Patent number 5,206,702
- Issue date Apr 27, 1993
- Olympus Optical Co., Ltd.
- Masahiko Kato
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,185,572
- Issue date Feb 9, 1993
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,138,159
- Issue date Aug 11, 1992
- Olympus Optical Co., Ltd.
- Tsugiko Takase
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical low-pass filter without using polarizers
- Patent number 5,091,795
- Issue date Feb 25, 1992
- Olympus Optical Co., Ltd.
- Kimihiko Nishioka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,083,022
- Issue date Jan 21, 1992
- Olympus Optical Co., Ltd.
- Hirofumi Miyamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor having a cantilever
- Patent number 5,079,958
- Issue date Jan 14, 1992
- Olympus Optical Co., Ltd.
- Tsugio Takase
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope having proper servo control function
- Patent number 5,059,793
- Issue date Oct 22, 1991
- Olympus Optical Co., Ltd.
- Hirofumi Miyamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for removing static electricity from charged articles exi...
- Patent number 5,057,966
- Issue date Oct 15, 1991
- Takasago Thermal Engineering Co., Ltd.
- Soichiro Sakata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for removing static electricity from charged articles exi...
- Patent number 5,047,892
- Issue date Sep 10, 1991
- Takasago Thermal Engineering Co., Ltd.
- Soichiro Sakata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe unit for an atomic probe microscope
- Patent number 5,041,783
- Issue date Aug 20, 1991
- Olympus Optical Co., Ltd.
- Hiroko Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Memory device with dual cantilever means
- Patent number 5,036,490
- Issue date Jul 30, 1991
- Olympus Optical Co., Ltd.
- Hiroshi Kajimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling spectroscope and a spectroscopic information det...
- Patent number 5,025,153
- Issue date Jun 18, 1991
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micro-displacement detector device, piezo-actuator provided with th...
- Patent number 4,987,303
- Issue date Jan 22, 1991
- Olympus Optical Co., Inc.
- Tsugiko Takase
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Liquid crystal eyeglass
- Patent number 4,919,520
- Issue date Apr 24, 1990
- Olympus Optical Company
- Takao Okada
- G02 - OPTICS
Information Patent Grant
Liquid crystal lenses having a Fresnel lens
- Patent number 4,904,063
- Issue date Feb 27, 1990
- Olympus Optical Co., Ltd.
- Takao Okada
- G02 - OPTICS
Information Patent Grant
Scanning type tunnel microscope
- Patent number 4,877,957
- Issue date Oct 31, 1989
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
AVIATION SYSTEM
- Publication number 20220299552
- Publication date Sep 22, 2022
- SUBARU CORPORATION
- Hiroyuki Tsubata
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION SYSTEM
- Publication number 20180031490
- Publication date Feb 1, 2018
- Bosch Packaging Technology K.K.
- Takao Okada
- G01 - MEASURING TESTING

Takao Okada

Person

Patents Grantslast 30 patents

Aviation system

Inspection device and inspection system

Air cleaning filter, process for preparing the same, and high-level...

Method for detecting a hybridized nucleic acid molecule

Air cleaning apparatus, air filter and method for manufacturing the...

Atomic probe microscope

Scanning tunneling potentio-spectroscopic microscope and a data det...

Scanning tunneling microscope

Scanning probe microscope having cantilever and detecting sample ch...

STM memory medium

Atomic force microscope

Atomic probe microscope

Lithography apparatus using scanning tunneling microscopy

Probe for a scanning tunneling microscope

Technique for canceling the effect of external vibration on an atom...

Scanning tunneling potentio-spectroscopic microscope and a data det...

Scanning tunneling microscope

Optical low-pass filter without using polarizers

Scanning tunneling microscope

Sensor having a cantilever

Scanning tunneling microscope having proper servo control function

Apparatus for removing static electricity from charged articles exi...

Apparatus for removing static electricity from charged articles exi...

Probe unit for an atomic probe microscope

Memory device with dual cantilever means

Scanning tunneling spectroscope and a spectroscopic information det...

Micro-displacement detector device, piezo-actuator provided with th...

Liquid crystal eyeglass

Liquid crystal lenses having a Fresnel lens

Scanning type tunnel microscope

Patents Applicationslast 30 patents

AVIATION SYSTEM

INSPECTION DEVICE AND INSPECTION SYSTEM