Takao Omae

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of and apparatus for inspecting pattern defects
- Patent number 5,764,793
- Issue date Jun 9, 1998
- Dainippon Screen Mfg. Co., Ltd.
- Takao Omae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and apparatus for inspecting the minimum annular width of...
- Patent number 5,408,538
- Issue date Apr 18, 1995
- Dainippon Screen Mfg. Co., Ltd.
- Ryuji Kitakado
- G06 - COMPUTING CALCULATING COUNTING