Takao Saeki

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probing apparatus with guarded signal traces
- Patent number 8,203,351
- Issue date Jun 19, 2012
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with an interchangeable probe insert
- Patent number 7,898,242
- Issue date Mar 1, 2011
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus with guarded signal traces
- Patent number 7,724,004
- Issue date May 25, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly with an interchangeable probe insert
- Patent number 7,498,825
- Issue date Mar 3, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBING APPARATUS WITH GUARDED SIGNAL TRACES
- Publication number 20100225344
- Publication date Sep 9, 2010
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT
- Publication number 20090160432
- Publication date Jun 25, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
PROBING APPARATUS WITH GUARDED SIGNAL TRACES
- Publication number 20070139061
- Publication date Jun 21, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Probe Card Assembly With An Interchangeable Probe Insert
- Publication number 20070007977
- Publication date Jan 11, 2007
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING