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Takao Sueyama

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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 11,923,299
    • Issue date Mar 5, 2024
    • Kioxia Corporation
    • Takao Sueyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 11,456,250
    • Issue date Sep 27, 2022
    • Kioxia Corporation
    • Takao Sueyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Testing apparatus
    • Patent number 11,090,694
    • Issue date Aug 17, 2021
    • TOSHIBA MEMORY CORPORATION
    • Tomoko Fujiwara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,861,930
    • Issue date Dec 8, 2020
    • TOSHIBA MEMORY CORPORATION
    • Takao Sueyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe card and having opposite surfaces with different directions a...
    • Patent number 9,933,478
    • Issue date Apr 3, 2018
    • TOSHIBA MEMORY CORPORATION
    • Tomoko Fujiwara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20230282747
    • Publication date Sep 7, 2023
    • KIOXIA Corporation
    • Takao SUEYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20220399267
    • Publication date Dec 15, 2022
    • KIOXIA Corporation
    • Takao SUEYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20210280508
    • Publication date Sep 9, 2021
    • Kioxia Corporation
    • Takao SUEYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    VOLTAGE-VARIABLE TYPE MEMORY ELEMENT AND SEMICONDUCTOR MEMORY DEVIC...
    • Publication number 20200295038
    • Publication date Sep 17, 2020
    • Toshiba Memory Corporation
    • Takao SUEYAMA
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200203529
    • Publication date Jun 25, 2020
    • Toshiba Memory Corporation
    • Takao SUEYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200091280
    • Publication date Mar 19, 2020
    • Toshiba Memory Corporation
    • Takao SUEYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TESTING APPARATUS
    • Publication number 20200030856
    • Publication date Jan 30, 2020
    • Toshiba Memory Corporation
    • Tomoko FUJIWARA
    • B08 - CLEANING
  • Information Patent Application

    PROBE CARD AND TEST APPARATUS
    • Publication number 20160291055
    • Publication date Oct 6, 2016
    • KABUSHIKI KAISHA TOSHIBA
    • Tomoko FUJIWARA
    • G01 - MEASURING TESTING