Takaomi Yokoyama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,674,913
- Issue date Jun 13, 2023
- Jeol Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
- Publication number 20240085357
- Publication date Mar 14, 2024
- JEOL Ltd.
- Hideyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026378
- Publication date Jan 27, 2022
- JEOL Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING