Takashi Akao

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Nagano, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for a semiconductor wafer
- Patent number 8,456,184
- Issue date Jun 4, 2013
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Probe card electrically connectable with a semiconductor wafer
- Patent number 8,149,008
- Issue date Apr 3, 2012
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Parallelism adjusting mechanism of probe card
- Patent number 8,049,525
- Issue date Nov 1, 2011
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,898,272
- Issue date Mar 1, 2011
- NHK Spring Co., Ltd.
- Shunsuke Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20100219852
- Publication date Sep 2, 2010
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20100164518
- Publication date Jul 1, 2010
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Application
PARALLELISM ADJUSTING MECHANISM OF PROBE CARD
- Publication number 20100001752
- Publication date Jan 7, 2010
- NHK SPRING CO., LTD.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20100001748
- Publication date Jan 7, 2010
- NHK Spring Co., Ltd.
- Shunsuke Sasaki
- G01 - MEASURING TESTING